S Hamdioui, A Orailoglu (2007), Design & Technology of Integrated Systems in Nanoscala era.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2007), Manifestation of precharge faults in high speed DRAM devices, Krasniewski, E. Gramatova, E. Girard, P., Garbolina, T. (Eds.), In 2007 IEEE workshop on Design and diagnostics of electronic circuits and systems p.179-184.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2007), Optimizing test length for soft faults in DRAM devices, s.n. (Eds.), In 25th IEEE VLSI Test Symposium p.59-66.

S Hamdioui, Z Al-Ars, J Jimenez, J Calero (2007), PPM recuction on embedded memories in system on chip, Lisa O'Conner (Eds.), In 12th IEEE European Test Symposium p.85-90.

K Bertels, SD Cotofana, GN Gaydadjiev, KGW Goossens, S Hamdioui, B Juurlink, AJ van Genderen, S Wong (2007), The Future of computing.

S Hamdioui, Z Al-Ars, GN Gaydadjiev, J delos Reyes (2006), Comparison of static and dynamic faults in 65nm memory technology, s.n. (Eds.), In International Design and Test workshop p.-.

Z Al-Ars, S Hamdioui, AJ van de Goor, GN Gaydadjiev, J Vollrath (2006), DRAM-specific space of memory tests, s.n. (Eds.), In International Test Conference 2006 p.1-10.

Z Al-Ars, S Hamdioui, AJ van de Goor, S Al-Harbi (2006), Influence of bit line coupling and twisting on the faulty behavior of DRAMs, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 25 p.2989-2996.

S Hamdioui, AJ van de Goor, J. Delos Reyes, M Rodgers (2006), Memory test experiment: industrial results and data, In IEE Proceedings: Computers and Digital Techniques Volume 153 p.1-8.

S Hamdioui, Z Al-Ars, AJ van de Goor (2006), Opens and delay faults in CMOS RAM address decoder, In IEEE Transactions on Computers Volume 55 p.1630-1639.