H. Aziza, M. Fieback, S. Hamdioui, H. Xun, M. Taouil (2025), Conductance variability in RRAM and its implications at the neural network level, In Microelectronics Reliability Volume 166.

T. S. Copetti, M. Fieback, T. Gemmeke, S. Hamdioui, L. M.Bolzani Poehls (2024), A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 40 p.245-257.

Muhammad Ali Siddiqi, David Vrijenhoek, Lennart P.L. Landsmeer, Job van der Kleij, Anteneh Gebregiorgis, Vincenzo Romano, Rajendra Bishnoi, Said Hamdioui, Christos Strydis (2024), A Lightweight Architecture for Real-Time Neuronal-Spike Classification, In CF '24 p.32-40, ACM.

Asmae El Arrassi, Mohammad Amin Yaldagard, Xingjian Tao, Taha Shahroodi, Fouwad Mir, Yashvardhan Biyani, Manil Dev Gomony, Anteneh Gebregiorgis, Rajiv Joshi, Said Hamdioui (2024), AFSRAM-CIM: Adder Free SRAM-Based Digital Computation-in-Memory for BNN, In Proceedings of the 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE.

H. Aziza, J. Postel-Pellerin, M. Fieback, S. Hamdioui, H. Xun, M. Taouil, K. Coulie, W. Rahajandraibe (2024), Analysis of Conductance Variability in RRAM for Accurate Neuromorphic Computing, In 2024 IEEE 25th Latin American Test Symposium (LATS), IEEE.

T. S. Copetti, A. Chordia, M. Fieback, M. Taouil, S. Hamdioui, L. M. Bolzani Poehls (2024), Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs, In 2024 IEEE 25th Latin American Test Symposium, LATS 2024, IEEE.

Stefan A. Lung, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil (2024), Counteracting Rowhammer by Data Alternation, In Proceedings - 2024 29th IEEE European Test Symposium, ETS 2024, IEEE.

Changhao Wang, Sicong Yuan, Hanzhi Xun, Chaobo Li, Mottaqiallah Taouil, Moritz Fieback, Danyang Chen, Xiuyan Li, Lin Wang, Riccardo Cantoro, Chujun Yin, Said Hamdioui (2024), Defects, Fault Modeling, and Test Development Framework for FeFETs, In Proceedings - 2024 IEEE International Test Conference, ITC 2024 p.91-95, IEEE.

Sicong Yuan, Mohammad Amin Yaldagard, Hanzhi Xun, Moritz Fieback, Erik Jan Marinissen, Woojin Kim, Siddharth Rao, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui (2024), Design-for-Test for Intermittent Faults in STT-MRAMs, In 2024 IEEE European Test Symposium (ETS).

S. Hamdioui, M. Taouil (2024), Device Aware Test for Memory Units.