Konstantinos Stavrakakis, Bas Smeele, Emmanouil Arapidis, Theofilos Spyrou, Anteneh Gebregiorgis, Stephan Wong, Georgi Gaydadjiev, Said Hamdioui (2026), X-Sim: An Accurate and Scalable Simulator for Memristive Computing-in-Memory Accelerators, In 2026 Design, Automation and Test in Europe Conference, DATE 2026 - Proceedings.

Pantazis Anagnostou, Arne Van Zegbroeck, Said Hamdioui, Christoph Adelmann, Florin Ciubotaru, Sorin Cotofana (2025), A Convoluted Journey from CMOS to Spin Waves, In Proceedings of the 2025 IEEE International Symposium on Circuits and Systems (ISCAS).

Sumit Diware, Yingzhou Dong, Mohammad Amin Yaldagard, Said Hamdioui, Rajendra Bishnoi (2025), Adaptive Multi-Threshold Encoding for Energy-Efficient ECG Classification Architecture Using Spiking Neural Network, In 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings.

A. El Arrassi, C. Yu, M. Taouil, R.V. Joshi, S. Hamdioui (2025), APX-DREAM-CIM: An Approximate Digital SRAM-Based CIM Accelerator for Edge AI, In Proceedings of the 2025 Cross-Disciplinary Conference on Memory-Centric Computing (CCMCC).

Yashvardhan Biyani, Rajendra Bishnoi, Theofilos Spyrou, Said Hamdioui (2025), C3CIM: Constant Column Current Memristor-Based Computation-in-Memory Micro-Architecture, In 2025 Design, Automation and Test in Europe Conference, DATE 2025 - Proceedings.

Y. Biyani, T. Spyrou, R. Bishnoi, S. Hamdioui (2025), C3CIM: Constant Column Current based Computation-in-Memory micro-architecture.

Jeroen J.A. Vermeulen, Georgii Krivoshein, Sumit Diware, Muhammad Ali Siddiqi, Arn M.J.M. van den Maagdenberg, Else A. Tolner, Said Hamdioui, Rajendra Bishnoi (2025), Classification of epileptiform activity in an intrahippocampal kainic acid mouse model, In Discover Applied Sciences Volume 7.

E. A. Serlis, H. Xun, E. Arapidis, A. Gebregiorgis, M. Taouil, S. Hamdioui, M. Fieback (2025), Combined Array and ADC Structural Test for RRAM-based Multiply-and-Accumulate Circuits, L. O’Conner (Eds.), In Proceedings of the 2025 IEEE International Test Conference (ITC) p.506-509.

H. Aziza, M. Fieback, S. Hamdioui, H. Xun, M. Taouil (2025), Conductance variability in RRAM and its implications at the neural network level, In Microelectronics Reliability Volume 166.

S. Hamdioui, M. Taouil (2025), Device-Aware Test: A Means to Attack Unmodelled Defects (Invited), In Proceedings of the 2025 62nd ACM/IEEE Design Automation Conference (DAC).