Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui (2023), Device Aware Diagnosis for Unique Defects in STT-MRAMs, In Proceedings of the 2023 IEEE 32nd Asian Test Symposium, ATS 2023, IEEE.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui (2023), Device-Aware Test for Back-Hopping Defects in STT-MRAMs, In 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings, IEEE.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Hassen Aziza (2023), Device-Aware Test for Ion Depletion Defects in RRAMs, Cristina Ceballos (Eds.), In Proceedings of the 2023 IEEE International Test Conference (ITC) p.246-255, IEEE.

Christopher Bengel, Anteneh Gebregiorgis, Stephan Menzel, Rainer Waser, Georgi Gaydadjiev, Said Hamdioui (2023), Devices and Architectures for Efficient Computing In-Memory (CIM) Design, Cristina Silvano, Marc Reichenbach, Christian Pilato (Eds.), In Embedded Computer Systems p.437-450, Springer.

Mahdi Zahedi, Taha Shahroodi, Stephan Wong, Said Hamdioui (2023), Efficient Signed Arithmetic Multiplication on Memristor-based Crossbar, In IEEE Access Volume 11 p.33964-33978.

Rajendra Bishnoi, Sumit Diware, Anteneh Gebregiorgis, Simon Thomann, Sara Mannaa, Bastien Deveautour, Cedric Marchand, Alberto Bosio, Damien Deleruyelle, Ian O'Connor, Hussam Amrouch, Said Hamdioui (2023), Energy-efficient Computation-In-Memory Architecture using Emerging Technologies, In Proceedings of the 2023 International Conference on Microelectronics, ICM 2023 p.325-334, IEEE.

Taha Shahroodi, Rafaela Cardoso, Mahdi Zahedi, Stephan Wong, Alberto Bosio, Ian O'Connor, Said Hamdioui (2023), Lightspeed Binary Neural Networks using Optical Phase-Change Materials, In Proceedings of the 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1-2, IEEE.

S. Yuan, Z. Zhang, M. Fieback, H. Xun, E. J. Marinissen, G. S. Kar, S. Rao, S. Couet, M. Taouil, S. Hamdioui (2023), Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs, In Proceedings - 2023 IEEE International Test Conference, ITC 2023 p.236-245, IEEE.

Sumit Diware, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi (2023), Mapping-aware Biased Training for Accurate Memristor-based Neural Networks, In AICAS 2023 - IEEE International Conference on Artificial Intelligence Circuits and Systems, Proceeding, IEEE.