Abhairaj Singh, Mahdi Zahedi, Taha Shahroodi, Mohit Gupta, Anteneh Gebregiorgis, Manu Komalan, Rajiv V. Joshi, Francky Catthoor, Rajendra Bishnoi, Said Hamdioui (2022), CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out, In Proceeding - IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2022 p.451-454, Institute of Electrical and Electronics Engineers (IEEE).

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2022), Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs, In IEEE Transactions on Computers Volume 71 p.2219-2233.

Anteneh Gebregiorgis, Abhairaj Singh, Sumit Diware, Rajendra Bishnoi, Said Hamdioui (2022), Dealing with Non-Idealities in Memristor Based Computation-In-Memory Designs, In Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) p.1-6, IEEE.

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui (2022), Defects, Fault Modeling, and Test Development Framework for RRAMs, In ACM Journal on Emerging Technologies in Computing Systems Volume 18.

Taha Shahroodi, Mahdi Zahedi, Can Firtina, Mohammed Alser, Stephan Wong, Onur Mutlu, Said Hamdioui (2022), Demeter: A Fast and Energy-Efficient Food Profiler Using Hyperdimensional Computing in Memory, In IEEE Access Volume 10 p.82493-82510.

Asmae El Arrassi, Anteneh Gebregiorgis, Anass El Haddadi, Said Hamdioui (2022), Energy-Efficient SNN Implementation Using RRAM-Based Computation In-Memory (CIM), In Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) p.1-6, IEEE.

Amirreza Yousefzadeh, Jan Stuijt, Martijn Hijdra, Hsiao-Hsuan Liu, Anteneh Gebregiorgis, Abhairaj Singh, Said Hamdioui, Francky Catthoor (2022), Energy-efficient In-Memory Address Calculation, In ACM Transactions on Architecture and Code Optimization Volume 19 p.1-16.

Troya Köylü, Luiza Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil (2022), Exploiting PUF Variation to Detect Fault Injection Attacks, Hana Kubatova, Andreas Steininger, Maksim Jenihhin, Tomasz Garbolino, Petr Fiser, Jan Belohoubek, Jaroslav Borecky (Eds.), In Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.74-79, IEEE.

T.S. Copetti, M. Nilovic, M. Fieback, T. Gemmeke, S. Hamdioui, L.M. Bolzani Poehls (2022), Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs, In Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS) p.1-6, IEEE.

G. C. Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. B. Poehls, S. Hamdioui (2022), Hierarchical Memory Diagnosis, In Proceedings - 2022 IEEE European Test Symposium, ETS 2022, Institute of Electrical and Electronics Engineers (IEEE).