A.B. Gebregiorgis, H.A. Du Nguyen, J. Yu, R.K. Bishnoi, M. Taouil, Catthoor Franky, S. Hamdioui (2022), A Survey on Memory-centric Computer Architectures, In ACM Journal on Emerging Technologies in Computing Systems Volume 18 p.1.

Felipe Augusto da Silva, Riccardo Cantoro, Said Hamdioui, Sandro Sartoni, Christian Sauer, Matteo Sonza Reorda (2022), A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers, In Electronics (Switzerland) Volume 11 p.1-19.

Abhairaj Singh, Moritz Fieback, Rajendra Bishnoi, Filip Bradarić, Anteneh Gebregiorgis, Rajiv V. Joshi, Said Hamdioui (2022), Accelerating RRAM Testing with a Low-cost Computation-in-Memory based DFT, Cristina Ceballos (Eds.), In Proceedings - 2022 IEEE International Test Conference, ITC 2022 p.400-409, IEEE .

Y. M. Blanter, J. J. Carmiggelt, S. Cotofana, S. Hamdioui, A. A. Nikitin, T. Reimann, S. Sharma, T. Van der Sar, X. Zhang, More Authors (2022), Advances in Magnetics Roadmap on Spin-Wave Computing, In IEEE Transactions on Magnetics Volume 58.

Ahmet Cagri Bagbaba, F. Augusto da Silva, Matteo Sonza Reorda, S. Hamdioui, Maksim Jenihhin, Christian Sauer (2022), Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips, In Electronics (Switzerland) Volume 11.

A.A.M. Aljuffri, Cezar Reinbrecht, S. Hamdioui, M. Taouil, Johanna Sepulveda (2022), Balanced Dual-Mask Protection Scheme for GIFT Cipher Against Power Attacks, In 2022 IEEE 40th VLSI Test Symposium (VTS).

Abhairaj Singh, Mahdi Zahedi, Taha Shahroodi, Mohit Gupta, Anteneh Gebregiorgis, Manu Komalan, Rajiv V. Joshi, Francky Catthoor, Rajendra Bishnoi, Said Hamdioui (2022), CIM-based Robust Logic Accelerator using 28 nm STT-MRAM Characterization Chip Tape-out, In Proceeding - IEEE International Conference on Artificial Intelligence Circuits and Systems, AICAS 2022 p.451-454, Institute of Electrical and Electronics Engineers (IEEE).

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2022), Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs, In IEEE Transactions on Computers Volume 71 p.2219-2233.

Anteneh Gebregiorgis, Abhairaj Singh, Sumit Diware, Rajendra Bishnoi, Said Hamdioui (2022), Dealing with Non-Idealities in Memristor Based Computation-In-Memory Designs, In Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) p.1-6, IEEE .

Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui (2022), Defects, Fault Modeling, and Test Development Framework for RRAMs, In ACM Journal on Emerging Technologies in Computing Systems Volume 18.