Sicong Yuan, Changhao Wang, Moritz Fieback, Hanzhi Xun, Mottaqiallah Taouil, Xiuyan Li, Danyang Chen, Lin Wang, Nicolo Bellarmino, Riccardo Cantoro, Said Hamdioui (2025), Device-Aware Test for Anomalous Charge Trapping in FeFETs, In ASP-DAC 2025 - 30th Asia and South Pacific Design Automation Conference, Proceedings p.635-641.

Changhao Wang, S. Yuan, N Kolahimahmoud, H. Xun, Nicolo Bellarmino, Danyang Chen, Chujun Yin, M. Taouil, M. Fieback, S. Hamdioui, More Authors (2025), Device-Aware Test for Threshold Voltage Shifting in FeFET, L. O’Conner (Eds.), In Proceedings of the 2025 IEEE International Test Conference (ITC) p.410-413.

A.E. El Arrassi, L.C.A. Huijbregts, Manil Dev Gomony, Anteneh Gebregiorgis, Francky Catthoor, M. Taouil, Rajiv V. Joshi, S. Hamdioui (2025), DREAM-CIM: A Digital SRAM-Based CIM Accelerator for Energy- and Area-Efficient Edge AI, In IEEE Transactions on Circuits and Systems for Artificial Intelligence Volume 2 p.211 - 221.

Lennart Paul Liong Landsmeer, Muhammad Ali Siddiqi, Heba Abunahla, Mario Negrello, Said Hamdioui, Christos Strydis (2025), Efficient and Realistic Brain Simulation: A Review and Design Guide for Memristor-Based Approaches, In Advanced Materials Technologies.

Lennart P.L. Landsmeer, Erbing Hua, Heba Abunahla, Muhammad Ali Siddiqi, Ryoichi Ishihara, Chris I. De Zeeuw, Said Hamdioui, Christos Strydis (2025), Efficient implementation of the Hodgkin-Huxley potassium channel via a single volatile memristor, In Frontiers in Neuroscience Volume 19.

Abhairaj Singh, Konstantinos Stavrakakis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui (2025), Energy-Efficient Multi-Operand XOR Logic-Based CIM Accelerator using RRAM technology, In 2025 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2025 - Conference Proceedings.

M. Jenihhin, J. Raik, A. Jutman, S. Mir, M. Taouil, M. Fieback, R. Bishnoi, S. Hamdioui, K. Ma, More Authors (2025), European Test Symposium Teams: an Anniversary Snapshot, In Proceedings - 2025 IEEE European Test Symposium, ETS 2025.

H. Aziza, H. Xun, M. Fieback, M. Taouil, S. Hamdioui (2025), Experimental Analysis and Circuit-Level Mitigation Strategies for Intermittent Errors in Resistive RAMs, In IEEE Transactions on Device and Materials Reliability Volume 26 p. 93 - 101.

T. S. Copetti, A. Chordia, M. Fieback, M. Taouil, S. Hamdioui, L. M. Bolzani Poehls (2025), Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs, In Microelectronics Reliability Volume 175.

N. Moeskops, A. Aljuffri, S. Hamdioui, M. Taouil (2025), Glitter PUF: A Passive Anti-Tamper PUF Based On Images Of Glitter Reflections, L. O’Conner (Eds.), In Proceedings of the 2025 IEEE International Test Conference (ITC) p.430-433.