S Hamdioui, AJ van de Goor Ph D (2000), An experimental analysis of spot defects in SRAMs: realistic fault models and test, DC Young (Eds.), In Proceedings of the ninth Asian test symposium p.131-138.

S Hamdioui, AJ van de Goor Ph D (2000), March tests for realistic faults in two-port memories, R Rajsuman, T Wik (Eds.), In Records of the 2000 IEEE international workshop on memory technology, design and testing p.73-78.

S Hamdioui, AJ van de Goor Ph D (2000), Testing address decoder faults in two-port memories: fault models, test, consequences of port restrictions, and test strategy, In Journal of Electronic Testing: theory and applications Volume 16 p.487-498.

S Hamdioui, AJ van de Goor Ph D (1999), March tests for word-oriented two-port memories, In Eighth Asian Test Symposium: proceedings p.53-60.

S Hamdioui, AJ van de Goor Ph D (1999), Port interference faults in two-port memories, In Proceedings p.1001-1010.