S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), March SL: a test for all static linked memory faults, s.n. (Eds.), In ATS 2003; proceedings of the twelfth Asian test symposium p.372-377.

S Hamdioui, AJ van de Goor, M Rodgers (2002), DPM Reduction on dual-port caches, In ETW'02: 7th IEEE European Test Workshop; Informal Digest p.55-60.

S Hamdioui, AJ van de Goor (2002), Efficient tests for realistic faults in dual-port SRAMS, In IEEE Transactions on Computers Volume 51 p.460-474.

S Hamdioui, AJ van de Goor, M Rodgers (2002), March SS: A test for all static simple RAM faults, B Courtois, T Wik, Y Zorian (Eds.), In Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) p.95-100.

S Hamdioui, Z Al-Ars, AJ van de Goor (2002), Testing static and dynamic faults in random access memories, In 20th VLSI Test symposium; Proceedings p.395-401.

S Hamdioui, AJ van de Goor (2002), Through testing of any multiport memory with linear tests, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 21 p.217-232.

S Hamdioui, AJ van de Goor, D Eastwick, M Rodgers (2001), Detecting unique faults in multi-port SRAMs, DC Young (Eds.), In Proceedings p.37-42.

S Hamdioui, AJ van de Goor, D Eastwick, M Rodgers (2001), Impact of spot defects on fault modeling and tests in dual-port memories, In ETW 2001: proceedings p.19-21.

S Hamdioui, AJ van de Goor, D Eastwick, M Rodgers (2001), Realistic fault models and test procedure for multi-port SRAMs, In Proceedings p.65-72.

S Hamdioui (2001), Testing multi-port memories: theory and practice, PhD Thesis Delft University of Technology.