S Hamdioui (2004), Testing static random access memories - Defects, fault models and test patters.

AJ van de Goor, S Hamdioui, Z Al-Ars (2004), Tests for address decoder delay faults in RAMs due to inter-gate opens, In Proceedings of the 9th IEEE European Test Symposium p.146-153.

AJ van de Goor, S Hamdioui, Z Al-Ars (2004), The effectiveness of Scan test and its new variants, FM Titsworth (Eds.), In Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004 p.26-31.

S Hamdioui, GN Gaydadjiev, AJ van de Goor (2004), The state-of-art future trends in testing embedded memories, FM Titsworth (Eds.), In Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004 p.54-59.

S Hamdioui, GN Gaydadjiev, AJ van de Goor (2003), A fault primitive based analysis of dynamic memory faults, s.n. (Eds.), In Proceedings of ProRISC 2003 p.84-89.

Z Al-Ars, S Hamdioui, AJ van de Goor (2003), A fault primitive based analysis of linked faults in RAMs, s.n. (Eds.), In MTDT 2003; Records of the 2003 international workshop on memory technology, design and testing p.33-39.

S Hamdioui, AJ van de Goor, M Rodgers (2003), Detecting intra-word faults in word-oriented memories, s.n. (Eds.), In 21th IEEE VLSI test symposium p.241-247.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), Dynamic faults in random-access-memories: concept, fault models and tests, In Journal of Electronic Testing: theory and applications Volume 19 p.195-205.

S Hamdioui, GN Gaydadjiev (2003), Future challenges in memory testing, s.n. (Eds.), In Proceedings of ProRISC 2003 p.78-83.

S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor (2003), Importance of dynamic faults for new SRAM technologies, s.n. (Eds.), In ETW 2003; Eighth IEEE European test workshop p.29-34.