Z Al-Ars, S Hamdioui, AJ van de Goor (2006), Space of DRAM fault models and corresponding testing, s.n. (Eds.), In Design Automation & Test in Europe DATE 06 p.1252-1257.

S Hamdioui, Z Al-Ars, LL Mhamdi, GN Gaydadjiev, S Vassiliadis (2006), Trends in tests and failure mechanisms in deep sub-micron technologies, P Girard, M Masmoudi, J Mouine, M Renovell (Eds.), In 2006 International conference on Design & Test of Integrated Systems in Nanoscale Technology p.216-221.

Z Al-Ars, S Hamdioui, GN Gaydadjiev (2006), Using linear tests for transient faults in DRAMs, s.n. (Eds.), In International Design and Test workshop p.-.

Z Al-Ars, S Hamdioui, G Mueller, AJ van de Goor (2005), Framework for fault analysis and test generation in drams, s.n. (Eds.), In Proceedings of design, automation and test in Europe 2005 (DATE 05) p.100-105.

S Hamdioui, Z Al-Ars, AJ van de Goor, R Wadsworth (2005), Impact of stresses on the fault coverage of memory tests, s.n. (Eds.), In Proceedings of the IEEE international workshop on memory technology, design and testing p.103-108.

S Hamdioui, JD Reyes (2005), New data-background sequences and their industrial evaluation for word-oriented random-access memories, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 24 p.892-904.

AJ van de Goor, S Hamdioui, R Wadsworth (2004), Detecting faults in peripheral circuits and an evaluation of SRAM tests, In Proceedings International Test Conference 2004 p.114-123.

Z Al-Ars, S Hamdioui, AJ van de Goor (2004), Effects of bit line coupling on the faulty behavior of DRAMs, In Proceedings 22nd IEEE VLSI test symposium p.1-6.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2004), Linked faults in random access memories: concept fault models, test algorithms, and industrial results, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 23 p.737-757.

S Hamdioui, R Wadsworth, J delos Reyes (2004), Memory fault modeling trends: a case study, In Journal of Electronic Testing: theory and applications Volume 20 p.245-255.