Abdulqader Mahmoud, Nicoleta Cucu-Laurenciu, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui (2022), Would Magnonic Circuits Outperform CMOS Counterparts?, In GLSVLSI 2022 - Proceedings of the Great Lakes Symposium on VLSI 2022 p.309-313, Association for Computing Machinery (ACM).

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2021), APmap: An Open-Source Compiler for Automata Processors, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 41 p.196-200.

Abdulqader Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana (2021), Achieving Wave Pipelining in Spin Wave Technology, In Proceedings of the 22nd International Symposium on Quality Electronic Design, ISQED 2021 p.54-59, IEEE.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2021), An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs, Randall S. Bilof (Eds.), In Proceedings - 2021 IEEE International Test Conference, ITC 2021 p.329-333, IEEE.

Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Applying Thermal Side-Channel Attacks on Asymmetric Cryptography, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1930 - 1942.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2021), Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM, In Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021 p.1717-1722, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

T.C. Köylü, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks, In 2021 18th International Conference on Privacy, Security and Trust (PST) p.1-10, IEEE.