M Taouil, S Hamdioui, E Marinissen (2011), On Modeling and Optimizing Cost in 3D Stacked-ICs, M Sawan, H Harmanani (Eds.), In 6th IEEE International Design and Test Workshop during ICECS 2011 p.24-29, IEEE Society.

AJ van de Goor, H Kukner, S Hamdioui (2011), Optimizing Memory BIST Address Generator Implementations, S Bernard, C Efstathiou (Eds.), In Proceedings 2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era p.1-6, IEEE Society.

NZB Haron, S Hamdioui (2011), Redundant Residue Number System Code for Fault-Tolerant Hybrid Memories, In ACM Journal on Emerging Technologies in Computing Systems Volume 7 p.1-19.

MSK Seyab, S Hamdioui (2011), ReverseAge: an Online NBTI Combating Technique Using Time Borrowing, M Sawan, H Harmanani (Eds.), In 6th IEEE International Design and Test Workshop (IDT 2011) p.36-41, IEEE Society.

M Taouil, S Hamdioui (2011), Stacking Order Impact on Overall 3D Die-to-Wafer Stacked-IC Cost, R Kraemer, A Steininger, A Pawlak, et al. (Eds.), In IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems p.335-340, IEEE Society.

M Taouil, S Hamdioui, CIM Beenakker, E Marinissen (2011), Test Impact on the Overall Die-to-Wafer 3D Stacked IC Cost, In Journal of Electronic Testing: theory and applications p.1-11.

IS Irobi, Z Al-Ars, S Hamdioui, C Thibeault (2011), Testing for Parasitic Memory Effect in SRAMs, A Chatterjee, A Patra, S Kundu, S Ravi (Eds.), In 20th IEEE Asian Test Symposium 2011 p.1-6, IEEE Society.

S Hamdioui, M Taouil (2011), Yield improvement and test cost optimization for 3D stacked ICs, A Chatterjee, A Patra, S Kundu, S Ravi (Eds.), In 20th IEEE Asian Test Symposium 2011 p.480-485, IEEE Society.

IS Irobi, Z Al-Ars, S Hamdioui (2010), Bit line coupling memory tests for single cell fails in SRAMs, s.n. (Eds.), In 28th IEEE VLSI test symposium p.1-6, IEEE Society.

IS Irobi, Z Al-Ars, S Hamdioui (2010), Detecting memory faults in the presence of bit line coupling in SRAM devices, s.n. (Eds.), In Intl. test conference 2010 p.1-10, IEEE Society.