Said Hamdioui, Mottaqiallah Taouil, Koen Bertels (2017), Memristor based computation-in-memory architecture for big data.

Said Hamdioui, Shahar Kvatinsky, Gert Cauwenberghs, Lei Xie, Nimrod Wald, Siddharth Joshi, Hesham Mostafa Elsayed, Henk Corporaal, Koen Bertels (2017), Memristor For Computing: Myth or Reality?, In Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.722-731.

Daniël Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2017), Mitigation of sense amplifier degradation using input switching, In Proceedings of the 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.858-863.

Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Razvan Nane, Said Hamdioui, Koen Bertels (2017), On the Implementation of Computation-in-Memory Parallel Adder, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 25 p.2206 - 2219.

Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Mottaqiallah Taouil, Said Hamdioui (2017), On the Robustness of Memristor Based Logic Gates, M. Dietrich, O. Novak (Eds.), In 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) p.158-163.

Peyman Pouyan, Esteve Amat, Said Hamdioui, Antonio Rubio (2017), Resistive Random Access Memory Variability and Its Mitigation Schemes, In Journal of Low Power Electronics Volume 13 p.124-134.

Lei Xie, Hoang Anh Du Nguyen, Jintao Yu, Ali Kaichouhi, Mottaqiallah Taouil, Mohammad AlFailakawi, Said Hamdioui (2017), Scouting Logic: A Novel Memristor-Based Logic Design for Resistive Computing, M. Hübner , R. Reis, M. Stan, N. Voros (Eds.), In 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) p.176-181.

Cleo Sgouropoulou, Ioannis Voyiatzis, A Koutoumanos, Said Hamdioui, Peyman Pouyan, Mariane Comte, Paolo Prinetto, G Airò Farulla, Peter Ellervee, Carlos Delgado Kloos, Raquel Crespo Garcia (2017), Standards-based tools and services for building lifelong learning pathways, In 2017 IEEE Global Engineering Education Conference (EDUCON) p.1619-1621.

Elena Ioana Vatajelu, Peyman Pouyan, Said Hamdioui (2017), State of the Art and Challenges for Test and Reliability of Emerging Non-volatile Resistive Memories, In International Journal of Circuit Theory and Applications p.1-25.

Said Hamdioui, Peyman Pouyan, Huawei Li, Ying Wang, Arijit Raychowdhur, Insik Yoon (2017), Test and Reliability of Emerging Non-Volatile Memories, L. O’Conner (Eds.), In 2017 IEEE 26th Asian Test Symposium (ATS) p.170-178.