Said Hamdioui, M. Fieback, S. Nagarajan, Mottaqiallah Taouil (2019), Testing Computation-in-Memory Architectures Based on Emerging Memories, In 2019 IEEE International Test Conference (ITC).

Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), Time-division Multiplexing Automata Processor, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.794-799.

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda (2019), Untestable faults identification in GPGPUs for safety-critical applications, In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 p.570-573.

G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui (2018), A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs, In Microelectronics Reliability Volume 88-90 p.355-359.

Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui, Koen Bertels (2018), A Mapping Methodology of Boolean Logic Circuits on Memristor Crossbar, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 37 p.311-323.

D. Kraak, I. Agbo, M. Taouil, S. Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018), Degradation analysis of high performance 14nm FinFET SRAM, In 2018 Design, Automation Test in Europe Conference Exhibition (DATE) p.201-206.

D. Kraak, M. Taouil, S. Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, N. Karimi (2018), Device aging: A reliability and security concern, In 2018 IEEE 23rd European Test Symposium (ETS) p.1-10.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui (2018), Electrical Modeling of STT-MRAM Defects, In International Test Conference - Proceedings p.1-10.

Said Hamdioui, Pierre Emmanuel Gaillardon, Dietmar Fey, Tajana Simunic Rosing (2018), Guest Editorial Memristive-Device-Based Computing, IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 26 p.2581-2583.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018), Impact and mitigation of SRAM read path aging, In Microelectronics Reliability Volume 87 p.158-167.