NZB Haron, S Hamdioui, Z Ahyadi (2010), ECC design for fault-tolerant crossbar memories: a case study, I Elahi, A Ivanov, Y Zorian, A Salem (Eds.), In 5th Intl. design and test workshop p.61-666, IEEE Society.

NZB Haron, S Hamdioui (2010), High-performance cluster-fault tolerance scheme for hybrid nanoelectronic memories, s.n. (Eds.), In 2010 IEEEIntl. symp. on defect and fault tolerance in VLSI systems p.144-151, IEEE Society.

M Taouil, S Hamdioui, E Marinissen (2010), Impact of various test flows on the cost in 3D die-to-wafer stacking, s.n. (Eds.), In Proceedings Intl. test conference 2010 p.1-6, IEEE Society.

AJ van de Goor, C Jung, S Hamdioui, GN Gaydadjiev (2010), Low-cost, customized and flexible SRAM MBIST engine, s.n. (Eds.), In IEEE Intl. symposium on design and diagnostics of electronic circuits and systems p.382-387, IEEE Society.

AJ van de Goor, S Hamdioui (2010), MBIST architecture framework based on orthogonal constructs, A Ivanov, I Elahi, Y Zorian, A Salem (Eds.), In 5th Intl. design and test workshop p.128-133, IEEE Society.

AJ van de Goor, GN Gaydadjiev, S Hamdioui (2010), Memory testing with a RISC microcontroller, s.n. (Eds.), In Design, automation & test in Europe 2010 p.214-219, IEEE Society.

NZB Haron, S Hamdioui (2010), Mitigating defective CMOS to non-CMOS vias in CMOS/molecular memories, s.n. (Eds.), In IEEE nano 2010 p.1-4, IEEE Society.

MSK Seyab, S Hamdioui (2010), NBTI modeling in the framework of temperature variation, s.n. (Eds.), In Design, automation & test in Europe p.1-4, s.n..

M Taouil, S Hamdioui, J Verbree, E Marinissen (2010), On maximizing the compound yield for 3D wafer-to-wafer stacked ICs, s.n. (Eds.), In Intl. TEST conference 2010 p.1-10, IEEE Society.

NZB Haron, S Hamdioui (2010), Redundant residue number system code for fault-tolerant hybrid memories, In ACM Journal on Emerging Technologies in Computing Systems p.1-19.