AMMO Cortez, S Hamdioui, R Ishihara (2015), Design dependent SRAM PUF robustness analysis, V Champac, Y Zorian (Eds.), In Proceedings - 16th IEEE Latin-American Test Symposium p.1-6.

L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels (2015), Fast boolean logic mapped on memristor crossbar, S Ozev, SW Chung (Eds.), In Proceedings of the 33rd IEEE International Conference on Computer Design, ICCD p.335-342.

IO Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, F Catthoor (2015), Integral impact of BTI and voltage temperature variation on SRAM sense amplifier, C Thibeault, L Anghel (Eds.), In Proceedings - 33rd IEEE VLSI Test Symposium p.1-6.

AMMO Cortez, S Hamdioui, A Kaichouhi, V van der Leest, R Maes, GJ Schrijen (2015), Intelligent voltage ramp-up time adaptation for temperature noise reduction on memory-based PUF systems, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 34 p.1162-1175.

L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels (2015), Interconnect networks for memristor crossbar, CA Moritz, M Rahman (Eds.), In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH p.124-129.

Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk Wouters, Linn Eike, Jan van Lunteren (2015), Memristor Based Computation-in-Memory Architecture for Data-Intensive Applications, W. Nebel (Eds.), In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition p.1718-1725.

S Hamdioui, M Taouil, HA Du Nguyen, A Haron, L Xie, K Bertels (2015), Memristor: the enabler of computation-in-memory architecture for big-data, s.n. (Eds.), In International Conference on Memristive Systems, MEMRISYS p.1-3.

Y Sfikas, YE Tsiatouhas, M Taouil, S Hamdioui (2015), On resistive open defect detection in DRAMs: The charge accumulation effect, L Miclea, P Prinetto (Eds.), In Proceedings - 20th IEEE European Test Symposium p.1-6.

M Taouil, S Hamdioui (2015), Post-bond interconnect test and diagnosis for 3-D memory stacked on logic, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 34 p.1860-1872.

P Bernardi, L Ciganda, MS Reorda, S Hamdioui (2015), SW-based transparent in-field memory testing, V Champac, Y Zorian (Eds.), In Proceedings - 16th IEEE Latin-American Test Symposium p.1-6.