S Hamdioui, JD Reyes (2005), New data-background sequences and their industrial evaluation for word-oriented random-access memories, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 24 p.892-904.

AJ van de Goor, S Hamdioui, R Wadsworth (2004), Detecting faults in peripheral circuits and an evaluation of SRAM tests, In Proceedings International Test Conference 2004 p.114-123, International Test Conference.

Z Al-Ars, S Hamdioui, AJ van de Goor (2004), Effects of bit line coupling on the faulty behavior of DRAMs, In Proceedings 22nd IEEE VLSI test symposium p.1-6, IEEE.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2004), Linked faults in random access memories: concept fault models, test algorithms, and industrial results, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 23 p.737-757.

S Hamdioui, R Wadsworth, J delos Reyes (2004), Memory fault modeling trends: a case study, In Journal of Electronic Testing: theory and applications Volume 20 p.245-255.

S Hamdioui (2004), Testing static random access memories - Defects, fault models and test patters, Kluwer Academic Publishers.

AJ van de Goor, S Hamdioui, Z Al-Ars (2004), Tests for address decoder delay faults in RAMs due to inter-gate opens, In Proceedings of the 9th IEEE European Test Symposium p.146-153, IEEE.

AJ van de Goor, S Hamdioui, Z Al-Ars (2004), The effectiveness of Scan test and its new variants, FM Titsworth (Eds.), In Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004 p.26-31, IEEE.

S Hamdioui, GN Gaydadjiev, AJ van de Goor (2004), The state-of-art future trends in testing embedded memories, FM Titsworth (Eds.), In Records of the 2004 International workshop on Memory Technology, Design and Testing MTDT 2004 p.54-59, IEEE.

S Hamdioui, GN Gaydadjiev, AJ van de Goor (2003), A fault primitive based analysis of dynamic memory faults, s.n. (Eds.), In Proceedings of ProRISC 2003 p.84-89, STW.