M Lefter, GR Voicu, M Taouil, M Enachescu, S Hamdioui, SD Cotofana (2013), Is TSV-based 3D integration suitable for inter-die memory repair?, s.n. (Eds.), In Design, automation & test in Europe conference & exhibition p.1-4.

S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis (2013), Reliability challenges of real-time systems in forthcoming technology nodes, s.n. (Eds.), In Design, automation & test in Europe conference & exhibition p.1-6.

M Taouil, S Hamdioui, EJ Marinissen, S Bhawmik (2013), Using 3D-COSTAR for 2.5D test cost optimization, s.n. (Eds.), In IEEE International 3D Systems Integration Conference p.1-8.

MSK Seyab, S Hamdioui (2013), Variability and reliability analyses in SRAM decoder, s.n. (Eds.), In 4th Workshop on design for reliability p.1-8.

M Taouil, S Hamdioui, EJ Marinissen, S Bhawmik (2012), 3D-COSTAR: a cost model for 3D stacked ICs, Y Zorian, E Marijnissen, S Hamdioui (Eds.), In Proceedings Third IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits p.1-6.

MSK Seyab, S Hamdioui (2012), Analyzing combined impacts of parameter variations and BTI in nano-scale logical gates, s.n. (Eds.), In 1st Workshop on manufacturable and dependable multicore architectures at nanoscale p.1-5.

MSK Seyab, S Hamdioui, H Kukner, F Catthoor, P Raghavan (2012), BTI Impacts on logical gates in nano-scale CMOS technology, s.n. (Eds.), In 15th IEEE Symposium on design and diagnostics of electronic circuits and systems p.1-6.

MSK Seyab, S Hamdioui, F Catthoor (2012), Comparative BTI analysis in nano-scale circuits lifetime, s.n. (Eds.), In 4th Workshop on design for reliability p.1-8.

NZB Haron, S Hamdioui (2012), DfT schemes for resistive open defects in RRAMs, s.n. (Eds.), In Design, automation & test in Europe conference & exhibition p.1-6.

M Taouil, M Lefter, S Hamdioui (2012), Exploring test opportunities for memory and interconnects in 3D ICs, s.n. (Eds.), In International design & test symposium p.1-6.