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S Hamdioui, AJ van de Goor, M Rodgers (2003), Detecting intra-word faults in word-oriented memories, s.n. (Eds.), In 21th IEEE VLSI test symposium p.241-247, IEEE Society.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), Dynamic faults in random-access-memories: concept, fault models and tests, In Journal of Electronic Testing: theory and applications Volume 19 p.195-205.

S Hamdioui, GN Gaydadjiev (2003), Future challenges in memory testing, s.n. (Eds.), In Proceedings of ProRISC 2003 p.78-83, STW.

S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor (2003), Importance of dynamic faults for new SRAM technologies, s.n. (Eds.), In ETW 2003; Eighth IEEE European test workshop p.29-34, IEEE Society.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), March SL: a test for all static linked memory faults, s.n. (Eds.), In ATS 2003; proceedings of the twelfth Asian test symposium p.372-377, IEEE Society.

S Hamdioui, AJ van de Goor, M Rodgers (2002), DPM Reduction on dual-port caches, In ETW'02: 7th IEEE European Test Workshop; Informal Digest p.55-60, IEEE Society.

S Hamdioui, AJ van de Goor (2002), Efficient tests for realistic faults in dual-port SRAMS, In IEEE Transactions on Computers Volume 51 p.460-474.

S Hamdioui, AJ van de Goor, M Rodgers (2002), March SS: A test for all static simple RAM faults, B Courtois, T Wik, Y Zorian (Eds.), In Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2002) p.95-100, IEEE Society.

S Hamdioui, Z Al-Ars, AJ van de Goor (2002), Testing static and dynamic faults in random access memories, In 20th VLSI Test symposium; Proceedings p.395-401, IEEE Society.