MSK Seyab, S Hamdioui (2010), Temperature dependence of NBTI induced delay, s.n. (Eds.), In 16th IEEE intl. on-line testing symposium p.1-6, IEEE Society.

MSK Seyab, S Hamdioui (2010), Temperature impact on NBTI modeling in the framework of technology scaling, Y Patt, P Foglia, E Duesterwald, P Faraboschi, X Martorell (Eds.), In 5th Intl. conf, HIPEAC 2010 p.1-10, Springer.

M Taouil, S Hamdioui, CIM Beenakker, E Marinissen (2010), Test cost analysis for 3D die-to-wafer stacking, s.n. (Eds.), In Proc. of the 19th Asian test symposium p.435-441, IEEE Society.

MSK Seyab, S Hamdioui (2010), Trends and challenges of SRAM reliability in the nano-scale era, s.n. (Eds.), In 2010 intl. conf. on design & technology of integrated systems in nanoscale Era p.1-6, IEEE Society.

AJ van de Goor, S Hamdioui, GN Gaydadjiev (2010), Using a CISC microcontroller to test embedded memories, s.n. (Eds.), In IEEE intl. symposium on design and diagnostics of electronic circuits and systems p.382-387, IEEE Society.

NZB Haron, S Hamdioui, SD Cotofana (2009), Emerging non-CMOS nanoelectronic devices-What are they?, s.n. (Eds.), In The 4th annual IEEE international conference on nano/micro engineered and molecular systems p.63-68, IEEE Society.

Z Al-Ars, S Hamdioui (2009), Fault diagnosis using test primitives in random access memories, s.n. (Eds.), In 18th Asian test symposium p.403-408, IEEE Society.

NZB Haron, S Hamdioui (2009), Fault tolerance architecture for reliable hybrid CMOS/nanodevices memory, ETS'09.

AJ van de Goor, S Hamdioui, GN Gaydadjiev, Z Al-Ars (2009), New algorithms for address decoder delay faults and bit line imbalance faults, s.n. (Eds.), In 18th Asian test symposium p.391-395, IEEE Society.

Z Al-Ars, S Hamdioui (2009), Non-algorithmic stress optimization using simulation for DRAMs, s.n. (Eds.), In 4th Intl. design and test workshop 2009 p.1-6, IEEE Society.