Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, In 2019 IEEE European Test Symposium (ETS) p.1-6.

Muath Abu Lebdeh, Uljana Reinsalu, Hoang Anh Du Nguyen, Stephan Wong, Said Hamdioui (2019), Memristive Device Based Circuits for Computation-in-Memory Architectures, In 2019 IEEE International Symposium on Circuits and Systems (ISCAS) p.1-5.

Anne Siemon, Dirk Wouters, Said Hamdioui, Stephan Menzel (2019), Memristive device modeling and circuit design exploration for computation-in-memory, In 2019 IEEE International Symposium on Circuits and Systems, ISCAS 2019 - Proceedings Volume 2019-May.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.162-167.

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 27 p.1308-1321.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar (2019), Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing, In 2019 IEEE European Test Symposium (ETS) p.1-6.

A. Bosio, I. O'Connor, G.S. Rodrigues, F.K. Lima, E.I. Vatajelu, G. di Natale, L. Anghel, Surya Nagarajan, M.C.R. Fieback, S. Hamdioui (2019), Rebooting Computing: The Challenges for Test and Reliability, In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability Volume 99 p.52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, In 2019 IEEE Latin American Test Symposium (LATS) p.1-6.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019), System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation, In Journal of Low Power Electronics Volume 15 p.1-10.