Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi Tahoori, Mottaqiallah Taouil, Said Hamdioui (2020), Testing Scouting Logic-Based Computation-in-Memory Architectures, In Proceedings - 2020 IEEE European Test Symposium, ETS 2020 p.1-6, IEEE.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2020), The Power of Computation-in-Memory Based on Memristive Devices, In 25th Asia and South Pacific Design Automation Conference (ASP-DAC) p.385-392, IEEE.

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), A Computation-In-Memory Accelerator Based on Resistive Devices, In Proceedings of the International Symposium on Memory Systems p.19-32, Association for Computing Machinery (ACM).

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando G. Redondo, G. Karunaratne, Abbas Rahimi, Luca Benini (2019), Applications of Computation-In-Memory Architectures based on Memristive Devices, In Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 p.486-491, IEEE.

E.I. Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui (2019), Challenges and Solutions in Emerging Memory Testing, In IEEE Transactions on Emerging Topics in Computing Volume 7 p.493-506.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.

M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE.

Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui (2019), Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era, In IEEE Access Volume 7 p.33115-33129.

Honorio Martin, Pedro Peris-Lopez, Giorgio Di Natale, Mottaqiallah Taouil, Said Hamdioui (2019), Enhancing PUF based challenge-response sets by exploiting various background noise configurations, In Electronics (Switzerland) Volume 8 p.1-14.