Hassan Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau, Patrick Girard, Arnaud Virazel, Karine Coulié (2021), Multi-level control of resistive ram (Rram) using a write termination to achieve 4 bits/cell in high resistance state, In Electronics (Switzerland) Volume 10.

M. Taouil, A.A.M. Aljuffri, S. Hamdioui (2021), Power Side Channel Attacks: Where Are We Standing?, In 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), IEEE.

Troya Çağıl Köylü, Hans Okkerman, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Protecting IoT Devices through a Hardware-driven Memory Verification, L. O'Conner (Eds.), In 2021 24th Euromicro Conference on Digital System Design (DSD) p.115-122, IEEE.

Luíza Caetano Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepulveda (2021), Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron, L. O'Conner (Eds.), In 2021 24th Euromicro Conference on Digital System Design (DSD) p.514-518, IEEE.

H.A. Du Nguyen, J. Yu, M.F.M. Abu Lebdeh, M. Taouil, S. Hamdioui, Francky Catthoor (2020), A Classification of Memory-Centric Computing, In ACM Journal on Emerging Technologies in Computing Systems Volume 16 p.1-26.

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, IEEE.

Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), A Security Verification Template to Assess Cache Architecture Vulnerabilities, In 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.1-6, IEEE.

H. Aziza, M. Moreau, M. Fieback, M. Taouil, S. Hamdioui (2020), An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs), In IEEE Access Volume 8 p.137263-137274.

L. Wu, M. Fieback, M. Taouil, S. Hamdioui (2020), Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level, In 2020 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2020), ESRAM Reliability: Why is it still not optimally solved?, In Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020, IEEE.