S. Hamdioui, M. Taouil, F. Smailbegovic (2020), Secure integrated circuit architecture.

S. Hamdioui, M. Taouil, F. Smailbegovic (2020), Secure integrated circuit architecture.

Jintao Yu, Razvan Nane, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui, Henk Corporaal, Koen Bertels (2020), Skeleton-based Synthesis Flow for Computation-In-Memory Architectures, In IEEE Transactions on Emerging Topics in Computing Volume 8 p.545-558.

Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi Tahoori, Mottaqiallah Taouil, Said Hamdioui (2020), Testing Scouting Logic-Based Computation-in-Memory Architectures, In Proceedings - 2020 IEEE European Test Symposium, ETS 2020 p.1-6, IEEE.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2020), The Power of Computation-in-Memory Based on Memristive Devices, In 25th Asia and South Pacific Design Automation Conference (ASP-DAC) p.385-392, IEEE.

Hoang Anh Du Nguyen, Jintao Yu, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), A Computation-In-Memory Accelerator Based on Resistive Devices, In Proceedings of the International Symposium on Memory Systems p.19-32, ACM.

Said Hamdioui, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Abu Sebastian, Manuel Le Gallo, Sandeep Pande, Siebren Schaafsma, Francky Catthoor, Shidhartha Das, Fernando G. Redondo, G. Karunaratne, Abbas Rahimi, Luca Benini (2019), Applications of Computation-In-Memory Architectures based on Memristive Devices, In Proceedings of the 2019 Design, Automation and Test in Europe Conference and Exhibition, DATE 2019 p.486-491, IEEE.

E.I. Vatajelu, Paolo Prinetto, Mottaqiallah Taouil, Said Hamdioui (2019), Challenges and Solutions in Emerging Memory Testing, In IEEE Transactions on Emerging Topics in Computing Volume 7 p.493-506.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.