Luíza Caetano Garaffa, Abdullah Aljuffri, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepulveda (2021), Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron, L. O'Conner (Eds.), In 2021 24th Euromicro Conference on Digital System Design (DSD) p.514-518, IEEE.

H.A. Du Nguyen, J. Yu, M.F.M. Abu Lebdeh, M. Taouil, S. Hamdioui, Francky Catthoor (2020), A Classification of Memory-Centric Computing, In ACM Journal on Emerging Technologies in Computing Systems Volume 16 p.1-26.

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, Institute of Electrical and Electronics Engineers (IEEE).

Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), A Security Verification Template to Assess Cache Architecture Vulnerabilities, In 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.1-6, IEEE.

H. Aziza, M. Moreau, M. Fieback, M. Taouil, S. Hamdioui (2020), An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs), In IEEE Access Volume 8 p.137263-137274.

L. Wu, M. Fieback, M. Taouil, S. Hamdioui (2020), Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level, In 2020 IEEE European Test Symposium (ETS) p.1-2, Institute of Electrical and Electronics Engineers (IEEE).

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2020), ESRAM Reliability: Why is it still not optimally solved?, In Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020, Institute of Electrical and Electronics Engineers (IEEE).

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2020), Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects, In 21st IEEE Latin-American Test Symposium, LATS 2020, Institute of Electrical and Electronics Engineers (IEEE).

Bruno Forlin, Ronaldo Husemann, Luigi Carro, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), G-PUF: An Intrinsic PUF Based on GPU Error Signatures, In 2020 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Bruno E. Forlin, Johanna Sepulveda (2020), Guard-NoC: A protection against side-channel attacks for MPSoCs, L. O'Conner (Eds.), In 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) p.536-541, IEEE.