Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2022), Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes, In Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1189-1192, IEEE.

Troya Çağıl Köylü, Said Hamdioui, Mottaqiallah Taouil (2022), Smart Redundancy Schemes for ANNs against Fault Attacks, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.

T.C. Köylü, M. Fieback, S. Hamdioui, M. Taouil (2022), Using Hopfield Networks to Correct Instruction Faults, In 2022 IEEE 31st Asian Test Symposium (ATS) p.102-107, IEEE.

Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2021), APmap: An Open-Source Compiler for Automata Processors, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 41 p.196-200.

Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Applying Thermal Side-Channel Attacks on Asymmetric Cryptography, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1930 - 1942.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2021), Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM, In Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021 p.1717-1722, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.