Troya Köylü, Luiza Garaffa, Cezar Reinbrecht, Mahdi Zahedi, Said Hamdioui, Mottaqiallah Taouil (2022), Exploiting PUF Variation to Detect Fault Injection Attacks, Hana Kubatova, Andreas Steininger, Maksim Jenihhin, Tomasz Garbolino, Petr Fiser, Jan Belohoubek, Jaroslav Borecky (Eds.), In Proceedings of the 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.74-79, IEEE.

G. C. Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. B. Poehls, S. Hamdioui (2022), Hierarchical Memory Diagnosis, In Proceedings - 2022 IEEE European Test Symposium, ETS 2022, Institute of Electrical and Electronics Engineers (IEEE).

Troya Çağıl Köylü, Cezar Reinbrecht, Marcelo Brandalero, Said Hamdioui, Mottaqiallah Taouil (2022), Instruction Flow-based Detectors against Fault Injection Attacks, In Microprocessors and Microsystems Volume 94.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2022), MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 41 p.4991-5004.

Cemil Cem Gursoy, Daniël Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui (2022), On BTI Aging Rejuvenation in Memory Address Decoders, In Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS) p.1-6, IEEE.

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi Tahoori (2022), PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama (2022), Rapid Design-Space Exploration for Low-Power Manycores under Process Variation utilizing Machine Learning, In IEEE Access Volume 10 p.70187-70203.

Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2022), Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes, In Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1189-1192, IEEE.

Troya Çağıl Köylü, Said Hamdioui, Mottaqiallah Taouil (2022), Smart Redundancy Schemes for ANNs against Fault Attacks, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.