Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Ahmed Aouichi, Sicong Yuan, Moritz Fieback, Siddharth Rao, Woojin Kim, Erik Jan Marinissen, Sebastien Couet, Mottaqiallah Taouil, Said Hamdioui (2023), Device Aware Diagnosis for Unique Defects in STT-MRAMs, In Proceedings of the 2023 IEEE 32nd Asian Test Symposium, ATS 2023, IEEE.

Sicong Yuan, Mottaqiallah Taouil, Moritz Fieback, Hanzhi Xun, Erik Jan Marinissen, Gouri Sankar Kar, Sidharth Rao, Sebastien Couet, Said Hamdioui (2023), Device-Aware Test for Back-Hopping Defects in STT-MRAMs, In 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings, IEEE.

Hanzhi Xun, Sicong Yuan, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Hassen Aziza (2023), Device-Aware Test for Ion Depletion Defects in RRAMs, Cristina Ceballos (Eds.), In Proceedings of the 2023 IEEE International Test Conference (ITC) p.246-255, IEEE.

S. Yuan, Z. Zhang, M. Fieback, H. Xun, E. J. Marinissen, G. S. Kar, S. Rao, S. Couet, M. Taouil, S. Hamdioui (2023), Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs, In Proceedings - 2023 IEEE International Test Conference, ITC 2023 p.236-245, IEEE.

Muhammad Ali Siddiqi, Jan Andrés Galvan Hernández, Anteneh Gebregiorgis, Rajendra Bishnoi, Christos Strydis, Said Hamdioui, Mottaqiallah Taouil (2023), Memristor-Based Lightweight Encryption, Smail Niar, Hamza Ouarnoughi, Amund Skavhaug (Eds.), In Proceedings of the 2023 26th Euromicro Conference on Digital System Design (DSD) p.634-641, IEEE.

Shayesteh Masoumian, Roel Maes, Rui Wang, Karthik Keni Yerriswamy, Geert-Jan Schrijen , Said Hamdioui, Mottaqiallah Taouil (2023), Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes, In Proceedings of the 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC), IEEE.

Moritz Fieback, Filip Bradarić, Mottaqiallah Taouil, Said Hamdioui (2023), Online Fault Detection and Diagnosis in RRAM, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Tara Ghasempouri, Jaan Raik, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2023), Survey on Architectural Attacks: A Unified Classification and Attack Model, In ACM Computing Surveys Volume 56.

A.B. Gebregiorgis, H.A. Du Nguyen, J. Yu, R.K. Bishnoi, M. Taouil, Catthoor Franky, S. Hamdioui (2022), A Survey on Memory-centric Computer Architectures, In ACM Journal on Emerging Technologies in Computing Systems Volume 18 p.1.