Thomas Makryniotis, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil (2024), Multi-Level FeFET-Based CAM Address Decoder, In 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2024), Online Detection of Unique Faults in RRAMs, In 2024 IEEE European Test Symposium (ETS).

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2024), Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs, L. O’Conner (Eds.), In Proceedings of the 2024 IEEE International Test Conference (ITC) p.374-383, IEEE.

S. Hamdioui, M. Taouil, F. Smailbegovic (2024), Secure integrated circuit architecture.

Sicong Yuan, Hanzhi Xun, Woojin Kim, Siddharth Rao, Erik Jan Marinissen, Sebastien Couet, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2024), Testing STT-MRAMs: Do We Need Magnets in our Automated Test Equipment?, In Proceedings - 2024 IEEE International Test Conference, ITC 2024 p.364-373, IEEE.

A.A.M. Aljuffri, R. Huang, L.V.M. Muntenaar, G. Gaydadjiev, Kezheng Ma, S. Hamdioui, M. Taouil (2024), The Security Evaluation of an Efficient Lightweight AES Accelerator †, In Cryptography Volume 8.

Abdullah Aljuffri, Mudit Saxena, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2023), A Pre-Silicon Power Leakage Assessment Based on Generative Adversarial Networks, Smail Niar, Hamza Ouarnoughi, Amund Skavhaug (Eds.), In Proceedings of the 2023 26th Euromicro Conference on Digital System Design (DSD) p.87-94, IEEE.

T.C. Köylü, Cezar Reinbrecht, A.B. Gebregiorgis, S. Hamdioui, M. Taouil (2023), A Survey on Machine Learning in Hardware Security, In ACM Journal on Emerging Technologies in Computing Systems Volume 19.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Leticia Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui (2023), Characterization and Test of Intermittent Over RESET in RRAMs, In Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS), IEEE.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.