G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui (2018), A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs, In Microelectronics Reliability Volume 88-90 p.355-359.

D. Kraak, I. Agbo, M. Taouil, S. Hamdioui, P. Weckx, S. Cosemans, F. Catthoor (2018), Degradation analysis of high performance 14nm FinFET SRAM, In 2018 Design, Automation Test in Europe Conference Exhibition (DATE) p.201-206.

D. Kraak, M. Taouil, S. Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, N. Karimi (2018), Device aging: A reliability and security concern, In 2018 IEEE 23rd European Test Symposium (ETS) p.1-10.

Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui (2018), Electrical Modeling of STT-MRAM Defects, In International Test Conference - Proceedings p.1-10, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018), Impact and mitigation of SRAM read path aging, In Microelectronics Reliability Volume 87 p.158-167.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti (2018), Ionizing radiation modeling in DRAM transistors, In 2018 IEEE 19th Latin-American Test Symposium, LATS 2018 Volume 2018-January p.1-6, IEEE.

Imran Ashraf, Nader Khammassi, Mottaqiallah Taouil, Koen Bertels (2018), Memory and Communication Profiling for Accelerator-Based Platforms, In IEEE Transactions on Computers Volume 67 p.934-948.

Jintao Yu, Hoang Anh Du Nguyen, Lei Xie, Mottaqiallah Taouil, Said Hamdioui (2018), Memristive devices for computation-in-memory, In Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1646-1651, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2018), Testing Resistive Memories: Where Are We and What Is Missing?, In International Test Conference 2018 - Proceedings p.1-9, IEEE.

Said Hamdioui, Mottaqiallah Taouil, Koen Bertels (2017), Computing device for "big data" applications using memristors.