M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE.

Sohaib Majzoub, Resve A. Saleh, Imran Ashraf, Mottaqiallah Taouil, Said Hamdioui (2019), Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era, In IEEE Access Volume 7 p.33115-33129.

Honorio Martin, Pedro Peris-Lopez, Giorgio Di Natale, Mottaqiallah Taouil, Said Hamdioui (2019), Enhancing PUF based challenge-response sets by exploiting various background noise configurations, In Electronics (Switzerland) Volume 8 p.1-14.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Hardware-based aging mitigation scheme for memory address decoder, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Methodology for Application-Dependent Degradation Analysis of Memory Timing, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.162-167, IEEE.

Daniël Kraak, Mottagiallah Taouil, Innocent Agbo, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2019), Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 27 p.1308-1321.

Lizhou Wu, Siddharth Rao, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Erik Jan Marinissen, Farrukh Yasin, Sebastien Couet, Said Hamdioui, Gouri Sankar Kar (2019), Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing, In 2019 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Praveen Raghavan, Francky Catthoor, Wim Dehaene (2019), Sense amplifier offset voltage analysis for both time-zero and time-dependent variability, In Microelectronics Reliability Volume 99 p.52-61.

Daniël Kraak, C. C. Gursoy, I. O. Agbo, M. Taouil, M. Jenihhin, J. Raik, S. Hamdioui (2019), Software-Based Mitigation for Memory Address Decoder Aging, In 2019 IEEE Latin American Test Symposium (LATS) p.1-6, IEEE.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019), System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation, In Journal of Low Power Electronics Volume 15 p.1-10.