IO Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, F Catthoor (2015), Integral impact of BTI and voltage temperature variation on SRAM sense amplifier, C Thibeault, L Anghel (Eds.), In Proceedings - 33rd IEEE VLSI Test Symposium p.1-6, IEEE Society.

L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels (2015), Interconnect networks for memristor crossbar, CA Moritz, M Rahman (Eds.), In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH p.124-129, IEEE Society.

I Ashraf, M Taouil, K Bertels (2015), Memory profiling for intra-application data-communication quantification: A survey, F Kurdahi, S Mir, MO Yu (Eds.), In Proceedings of the 10th International Design and Test Symposium p.32-37, IEEE Society.

Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk Wouters, Linn Eike, Jan van Lunteren (2015), Memristor Based Computation-in-Memory Architecture for Data-Intensive Applications, W. Nebel (Eds.), In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition p.1718-1725, IEEE.

S Hamdioui, M Taouil, HA Du Nguyen, A Haron, L Xie, K Bertels (2015), Memristor: the enabler of computation-in-memory architecture for big-data, s.n. (Eds.), In International Conference on Memristive Systems, MEMRISYS p.1-3, IEEE Society.

Y Sfikas, YE Tsiatouhas, M Taouil, S Hamdioui (2015), On resistive open defect detection in DRAMs: The charge accumulation effect, L Miclea, P Prinetto (Eds.), In Proceedings - 20th IEEE European Test Symposium p.1-6, IEEE Society.

M Taouil, S Hamdioui (2015), Post-bond interconnect test and diagnosis for 3-D memory stacked on logic, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 34 p.1860-1872.

M Taouil, S Hamdioui, EJ Marinissen (2015), Yield Improvement for 3D wafer-to-wafer stacked ICs using wafer matching, In ACM Transactions on Design Automation of Electronic Systems Volume 20 p.1-23.

EJ Marinissen, B De Wachter, K Smith, J Kiesewetter, M Taouil, S Hamdioui (2014), Direct probing on large-array fine-pitch micro-bumps of a wide-I/O logic-memory interface, M Purtell, S Mitra (Eds.), In Proceedings 2014 IEEE International Test Conference p.1-10, ITC & IEEE.

M Taouil, M Masadeh, S Hamdioui, EJ Marinissen (2014), Interconnect test for 3D stacked memory-on-logic, W Nebel, G Fettweis (Eds.), In Proceedings of the 2014 International Conference on Design, Automation & Test in Europe p.1-6, EDAA.