Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.
Mahdi Zahedi, Taha Shahroodi, Geert Custers, Abhairaj Singh, Stephan Wong, Said Hamdioui (2022), System Design for Computation-in-Memory: From Primitive to Complex Functions, In Proceedings of the 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) p.1-6, IEEE.
G. Cardoso Medeiros (2022), Test and Diagnosis of Hard-to-Detect Faults in FinFET SRAMs, PhD Thesis Delft University of Technology.
T.C. Köylü, M. Fieback, S. Hamdioui, M. Taouil (2022), Using Hopfield Networks to Correct Instruction Faults, In 2022 IEEE 31st Asian Test Symposium (ATS) p.102-107, IEEE.
Josie E.Rodriguez Condia, Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Juan-David Guerrero-Balaguera, Said Hamdioui, Christian Sauer, Matteo Sonza Reorda (2022), Using STLs for Effective In-field Test of GPUs, In IEEE Design & Test Volume 40 p.109-117.
Petros Arvanitis, Jan Harm L.F. Betting, Laurens W.J. Bosman, Zaid Al-Ars, Christos Strydis (2022), WhiskEras 2.0: Fast and Accurate Whisker Tracking in Rodents, Alex Orailoglu, Matthias Jung, Marc Reichenbach (Eds.), In Embedded Computer Systems p.210-225, Springer.
Abdulqader Mahmoud, Nicoleta Cucu-Laurenciu, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui (2022), Would Magnonic Circuits Outperform CMOS Counterparts?, In GLSVLSI 2022 - Proceedings of the Great Lakes Symposium on VLSI 2022 p.309-313, ACM.
Jintao Yu, Muath Abu Lebdeh, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Said Hamdioui (2021), APmap: An Open-Source Compiler for Automata Processors, In IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Volume 41 p.196-200.
Abdulqader Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana (2021), Achieving Wave Pipelining in Spin Wave Technology, In Proceedings of the 22nd International Symposium on Quality Electronic Design, ISQED 2021 p.54-59, IEEE.
Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2021), An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs, Randall S. Bilof (Eds.), In Proceedings - 2021 IEEE International Test Conference, ITC 2021 p.329-333, IEEE.