Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi Tahoori (2022), PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Anteneh Gebregiorgis, Artemis Zografou, Said Hamdioui (2022), RRAM Crossbar-Based Fault-Tolerant Binary Neural Networks (BNNs), In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Sohaib Majzoub, Resve A. Saleh, Mottaqiallah Taouil, Said Hamdioui, Mohamed Bamakhrama (2022), Rapid Design-Space Exploration for Low-Power Manycores under Process Variation utilizing Machine Learning, In IEEE Access Volume 10 p.70187-70203.

P. Bernardi, R. Cantoro, A. Coyette, W. Dobbeleare, M. Fieback, A. Floridia, G. Gielenk, A. M. Guerriero, S. Hamdioui, More Authors (2022), Recent Trends and Perspectives on Defect-Oriented Testing, Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos (Eds.), In Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, IEEE.

Abhairaj Singh, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui (2022), Referencing-in-Array Scheme for RRAM-based CIM Architecture, Cristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu (Eds.), In Proceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 p.1413-1418, IEEE.

Shayesteh Masoumian, Georgios Selimis, Rui Wang, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2022), Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes, In Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1189-1192, IEEE.

Troya Çağıl Köylü, Said Hamdioui, Mottaqiallah Taouil (2022), Smart Redundancy Schemes for ANNs against Fault Attacks, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Anteneh Gebregiorgis, Lizhou Wu, Christopher Münch, Siddharth Rao, Mehdi B. Tahoori, Said Hamdioui (2022), Special Session: STT-MRAMs: Technology, Design and Test, In Proceedings - of the 2022 IEEE 40th VLSI Test Symposium, VTS 2022, IEEE.

Jelmer M. Boter, Juan P. Dehollain, Jeroen P.G. Van Dijk, Yuanxing Xu, Toivo Hensgens, Richard Versluis, Henricus W.L. Naus, Menno Veldhorst, Fabio Sebastiano, Lieven M.K. Vandersypen (2022), Spiderweb Array: A Sparse Spin-Qubit Array, In Physical Review Applied Volume 18.

Abdulqader Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Said Hamdioui, Sorin Cotofana (2022), Spin Wave Based Approximate Computing, In IEEE Transactions on Emerging Topics in Computing Volume 10 p.1932-1940.