Abdullah Aljuffri, Marc Zwalua, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2021), Applying Thermal Side-Channel Attacks on Asymmetric Cryptography, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1930 - 1942.

Xiao Xue, Bishnu Patra, Jeroen P.G. van Dijk, Nodar Samkharadze, Andrea Corna, Brian Paquelet Wuetz, Amir Sammak, Giordano Scappucci, Menno Veldhorst, Fabio Sebastiano, Masoud Babaie, Edoardo Charbon, Lieven M.K. Vandersypen (2021), CMOS-based cryogenic control of silicon quantum circuits, In Nature Volume 593 p.205-210.

L. Wu, Siddharth Rao, M. Taouil, Erik Jan Marinissen, Gouri Sankar Kar, S. Hamdioui (2021), Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM, In Proceedings of the 2021 Design, Automation and Test in Europe, DATE 2021 p.1717-1722, IEEE.

P.A. 't Hart, M. Babaie, A. Vladimirescu, F. Sebastiano (2021), Characterization and Modeling of Self-Heating in Nanometer Bulk-CMOS at Cryogenic Temperatures, In IEEE Journal of the Electron Devices Society Volume 9 p.891-901.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2021), Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs, In 2020 IEEE International Test Conference, ITC 2020 p.1-10, IEEE.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

T.C. Köylü, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Deterministic and Statistical Strategies to Protect ANNs against Fault Injection Attacks, In 2021 18th International Conference on Privacy, Security and Trust (PST) p.1-10, IEEE.

S. Hamdioui, M. Taouil (2021), Device Aware Test for Memory Units.

Alberto Bosio, Ian O'Connor, Marcello Traiola, Jorge Echavarria, Jürgen Teich, Muhammad Abdullah Hanif, Muhammad Shafique, Said Hamdioui, Bastien Deveautour, Patrick Girard, Arnaud Virazel, Koen Bertels (2021), Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*, In 2021 IEEE European Test Symposium (ETS), IEEE.