E. Brum, M. Fieback, T.S. Copetti, H. Jiayi, S. Hamdioui, F. Vargas, L.M. Bolzani Poehls (2021), Evaluating the Impact of Process Variation on RRAMs, In 2021 IEEE 22nd Latin American Test Symposium, LATS 2021 p.1-6, IEEE.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago Balen (2021), Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.383-394.

Abdulqader Mahmoud, Christoph Adelmann, Frederic Vanderveken, Sorin Cotofana, Florin Ciubotaru, Said Hamdioui (2021), Fan-out of 2 Triangle Shape Spin Wave Logic Gates, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.948-953, IEEE.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2021), Flip Flop Weighting: A technique for estimation of safety metrics in Automotive Designs, In 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) p.1-7, IEEE.

Cezar Reinbrecht, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil, Johanna Sepulveda (2021), GRINCH: A Cache Attack against GIFT Lightweight Cipher, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.549-554, IEEE.

Johanna Barzen, Sebastian Feld, Frank Leymann, Karoline Wild (2021), Guest editorial: Selected extended papers from the Quantum Software Architecture Workshop at IEEE International Conference on Software Architecture 2021 (ICSA 2021), IET Quantum Communication Volume 2 p.139-140.

G. Cardoso Medeiros, M. Fieback, L. Wu, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Hard-to-Detect Fault Analysis in FinFET SRAMs, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1271-1284.

A.A.M. Aljuffri, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2021), Impact of Data Pre-Processing Techniques on Deep Learning Based Power Attacks, In 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).

G. Cardoso Medeiros, M. Fieback, Thiago Copetti, A.B. Gebregiorgis, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Improving the Detection of Undefined State Faults in FinFET SRAMs, In International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS), IEEE.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2021), Intermittent Undefined State Fault in RRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.