IS Irobi, Z Al-Ars (2009), Worst-case bit line coupling backgrounds for open defects in SRAM cells, s.n. (Eds.), In 20th annual workshop on circuits, systems and signal processing p.25-30, STW.

L Hasan, Z Al-Ars, Z Nawaz (2008), A novel approach for accelerating the Smith-Waterman algorithm using recursive variable expansion, s.n. (Eds.), In 19th Annual Workshop on Circuits, Systems and Signal Processing p.40-45, STW.

Z Nawaz, M Shabbir, Z Al-Ars, KLM Bertels (2008), Acceleration of Smith-Waterman using recursive variable expansion, L Fanucci (Eds.), In 11th Euromicro Conference on Digital System Design, Architectures, Methods and tools p.915-922, s.n..

L Hasan, Z Al-Ars (2008), Accurate profiling and acceleration evaluation of the Smith-Waterman algorithm using the Molen platform, Pedro Isaias Nuno Guimaraes (Eds.), In IADIS International Conference Applied Computing 2008 p.188-194, IADIS Press.

S Di Carlo, P Prinetto, A Scionti, Z Al-Ars (2008), Automating defects simulation and fault modeling for SRAMs, s.n. (Eds.), In IEEE Intl. High Level Design Validation and Test workshop 2008 p.1-8, IEEE.

S Hamdioui, Z Al-Ars, J Jimenez, J Calero (2008), BIST enhancement for detecting bit/byte write enable faults in SOC SCRAMs, s.n. (Eds.), In 2nd IEEE Intl. Conf. on Signals, Circuits & Systems p.1-5, IEEE.

Z Al-Ars, S Hamdioui, AJ van de Goor, G Mueller (2008), Defect oriented testing of the strap problem under process variations in DRAMs, s.n. (Eds.), In Proc. International Test Conference 2008 p.1-10, ITC.

S Hamdioui, Z Al-Ars (2008), Efficient tests and DFT for RAM address decoder delay faults, s.n. (Eds.), In 3rd International Design and Test workshop p.225-230, IEEE.

Z Al-Ars, S Hamdioui (2008), Evaluation of SRAM faulty behavior under bit line coupling, s.n. (Eds.), In 3rd International Design and Test workshop p.231-236, IEEE.

L Hasan, Z Al-Ars, Z Nawaz, K Bertels (2008), Hardware implementation of the Smith-Waterman algorithm using recursive variable expansion, M Abid, M Loulou, A Salem, Y Zorian, A Ivanov (Eds.), In 2008 Third international design and test workshop p.135-140, IEEE.