PD Joshi, S Hamdioui (2014), Security methods in fault tolerant modified line graph based networks, M Ottavi, S Hamdioui (Eds.), In Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.57-62, IEEE.

PD Joshi, S Hamdioui (2014), Shortest path reduction in a class of uniform fault tolerant networks, M Ottavi, S Hamdioui (Eds.), In Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.234-239, IEEE.

R Choupani, S Wong, M Tolun (2014), Spatial multiple description coding for scalable video streams, In International Journal of Digital Multimedia Broadcasting Volume 2014 p.1-8.

AMMO Cortez, G Roelofs, S Hamdioui, G. di Natale (2014), Testing PUF-based secure key storage circuits, G Fettweis, W Nebel (Eds.), In Proceedings of the 2014 International Conference on Design, Automation & Test in Europe p.1-6, EDAA.

AMMO Cortez, G Roelofs, S Hamdioui, G. di Natale (2014), Testing methods for PUF-based secure key storage circuits, In Journal of Electronic Testing: theory and applications Volume 30 p.581-594.

C Chen, SD Cotofana (2014), Towards an effective utilization of partially defected interconnections in 2D mesh NoCs, SP Mohanty, N Ranganathan, S Bhanja (Eds.), In Proceedings - 2014 IEEE Computer Society Annual Symposium on VLSI p.492-497, IEEE.

T Marconi, C Spagnol, E Popovici, SD Cotofana (2014), Towards energy effective LDPC decoding by exploiting channel noise variability, L Garcia (Eds.), In Proceedings - 2014 22nd International Conference on Very Large Scale Integration p.1-6, IEEE.

GR Voicu, M Lefter, M Enachescu, SD Cotofana (2013), 3D stacked wide-operand adders: A case study, T El-Ghawazi, M Smith et al (Eds.), In Proceedings 2013 IEEE 24th International Conference on Application-specific Systems, Architectures and Processors p.133-141, IEEE.

SM Alavi, GR Voicu, RB Staszewski, LCN de Vreede, JR Long (2013), A 2×13-bit all-digital I/Q RF-DAC in 65-nm CMOS, TM Hancock (Eds.), In Digest of Papers - 2013 IEEE Radio Frequency Integrated Circuits Symposium p.167-170, IEEE.

N Cucu Laurenciu, SD Cotofana (2013), A direct measurement scheme of amalgamated aging effects with novel on-chip sensor, s.n. (Eds.), In 21st IFIP/IEEE international conference on very large scale integration p.1-6, IEEE.