Rafaël Brandt, Nicola Strisciuglio, Daan Raatjes, Georgi Gaydadjiev (2027), BEAM: Exact Benchmarking of Explainable AI Attribution Methods, Maria De Marsico, Tin Kam Ho, Frederic Jurie, Cheng-Lin Liu, Daniel Lopresti, Ingela Nyström, Jean-Marc Ogier, Arun Ross, Liang Wang (Eds.), In Pattern Recognition - 28th International Conference, ICPR 2026, Proceedings p.353-367.

Xiaohua Huang, Hoda Yassin, Beatriz Lafuente Alcazar, Arash Akhoundi, Dante G. Muratore (2026), A Bidirectional Neuromodulation Chipset With Algorithm-Aware AFE Optimization and High-Voltage-Compliant Stimulation, In IEEE Journal of Solid-State Circuits Volume 61 p.1538-1550.

Fouwad Jamil Mir, Asmae El Arrassi, Said Hamdioui, Mottaqiallah Taouil (2026), A CIM-based Gaussian Random Number Generator for Edge Devices as Security Primitive, In Proceedings - 2026 IEEE European Test Symposium, ETS 2026.

Changhao Wang, Sicong Yuan, Nicolo Bellarmino, Danyang Chen, Hanzhi Xun, Lin Wang, Mottaqiallah Taouil, Moritz Fieback, Said Hamdioui, More Authors (2026), A Data-Driven ANN-Based Model for FeCAP and FeFET: Orienting to SPICE and Circuit Design, In IEEE Electron Device Letters Volume 47 p.1233-1236.

Emmanouil Arapidis, Theofilos Spyrou, Konstantinos Stavrakakis, Emmanouil Anastasios Serlis, Moritz Fieback, Said Hamdioui, Anteneh Gebregiorgis (2026), Analysis and Mitigation of IR Drop in Memristor-based AI Hardware Accelerators, In 2026 Design, Automation and Test in Europe Conference, DATE 2026 - Proceedings.

Y. Waheed, M.N. Noor, I. Ashraf (2026), A Systematic Review on Synthetic Medical Images Generation: Recent Trends and Future Opportunities, In Diagnostics Volume 16.

Asmaa Kassimi, Abdullah Aljuffri, Said Hamdioui, Mottaqiallah Taouil (2026), Bridging the Speed-Accuracy Gap: Layout-Aware Pre-Silicon Side-Channel Analysis, In Proceedings - 2026 IEEE European Test Symposium, ETS 2026.

A. V. Zegbroeck, E. V. Meirvenne, P. Anagnostou, F. Ciubotaru, C. Adelmann, S. Hamdioui, S. Cotofana (2026), Can Electro-Mechanical Stress Enable Effective Majority Logic Implementations?, In IEEE Open Journal of Nanotechnology Volume 7 p.34-40.

P. Chaidos, A. Maras, Theofilos Spyrou, A.B. Gebregiorgis, S. Hamdioui, Dimitrios Soudris, Sotirios Xydis (2026), CIM-FI: A HW-Aware Fault Injection Framework for Digital Compute-In-Memory DNN Accelerators, In Proceedings of the 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS).

E. Soli, A. Vladimirescu, M. Babaie, S. Hamdioui, F. Sebastiano (2026), Cryogenic Hot Carrier Degradation and Threshold-Voltage Turn-Around Effect in 5-V CMOS Transistors, In Proceedings of the 2026 IEEE International Reliability Physics Symposium (IRPS) p.1-5.