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Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk Wouters, Linn Eike, Jan van Lunteren (2015), Memristor Based Computation-in-Memory Architecture for Data-Intensive Applications, W. Nebel (Eds.), In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition p.1718-1725, IEEE.

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Y Sfikas, YE Tsiatouhas, M Taouil, S Hamdioui (2015), On resistive open defect detection in DRAMs: The charge accumulation effect, L Miclea, P Prinetto (Eds.), In Proceedings - 20th IEEE European Test Symposium p.1-6, IEEE.

M Taouil, S Hamdioui (2015), Post-bond interconnect test and diagnosis for 3-D memory stacked on logic, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 34 p.1860-1872.