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IO Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, F Catthoor (2015), Integral impact of BTI and voltage temperature variation on SRAM sense amplifier, C Thibeault, L Anghel (Eds.), In Proceedings - 33rd IEEE VLSI Test Symposium p.1-6, IEEE.

AMMO Cortez, S Hamdioui, A Kaichouhi, V van der Leest, R Maes, GJ Schrijen (2015), Intelligent voltage ramp-up time adaptation for temperature noise reduction on memory-based PUF systems, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 34 p.1162-1175.

L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels (2015), Interconnect networks for memristor crossbar, CA Moritz, M Rahman (Eds.), In Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, NANOARCH p.124-129, IEEE.

N Cucu Laurenciu, SD Cotofana (2015), Low cost and energy, thermal noise driven, probability modulated random number generator, M de Medeiras Silva (Eds.), In Proceedings - 2015 IEEE International Symposium on Circuits and Systems p.2724-2727, IEEE.

G Nazarian, R Nane, GN Gaydadjiev (2015), Low-Cost Software Control-Flow Error Recovery, J Canas Ferreira, P Kitsos (Eds.), In Proceedings of the Euromicro Conference on Digital System Design p.510-517, IEEE.

MAP Pertijs, SB Raghunathan, C Chen, ZY Chang, M Shabanimotlagh, EC Noothout, S Blaak, J Ponte, C Prins, H Bosch, MD Verweij, N de Jong (2015), Low-power receive electronics for a miniature real-time 3D ultrasound probe, s.n. (Eds.), In Proceedings of the 6th IEEE International Workshop on Advances in Sensors and Interfaces p.235-238, IEEE.

I Ashraf, M Taouil, K Bertels (2015), Memory profiling for intra-application data-communication quantification: A survey, F Kurdahi, S Mir, MO Yu (Eds.), In Proceedings of the 10th International Design and Test Symposium p.32-37, IEEE.

Said Hamdioui, Lei Xie, Hoang Anh Du Nguyen, Mottaqiallah Taouil, Koen Bertels, Henk Corporaal, Hailong Jiao, Francky Catthoor, Dirk Wouters, Linn Eike, Jan van Lunteren (2015), Memristor Based Computation-in-Memory Architecture for Data-Intensive Applications, W. Nebel (Eds.), In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition p.1718-1725, IEEE.

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