P Juszczak, DMJ Tax, S Verzakov, RPW Duin (2006), Domain based LDA and QDA, s.n. (Eds.), In Proceedings of the 18th international conference on pattern recognition p.1-4, IEEE.

S Harmeling, G Dornhege, DMJ Tax, F Meinecke, K-R Müller (2006), From outliers to prototypes: Ordering data, In Neurocomputing Volume 69 p.1608-1618.

Y Arzhaeva, B van Ginneken, DMJ Tax (2006), Image classification from generalized image distance features: application to detection of interstitial disease in chest radiographs, s.n. (Eds.), In Proceedings of the 18th international conference on pattern recognition p.1-4, IEEE.

Y Arzhaeva, DMJ Tax, B van Ginneken (2006), Improving computer-aided diagnosis of interstitial disease in chest radiographs by combining one-class and two-class classifiers, JM Reinhardt, JPW Pluim (Eds.), In Proceedings of SPIE Medical Imaging 2006: Image Processing p.1-8, SPIE.

DMJ Tax, RPW Duin, Y Arzhaeva (2006), Linear model combining by optimizing the area under the ROC curve, s.n. (Eds.), In Proceedings of the 18th international conference on pattern recognition p.1-4, IEEE.

DMJ Tax, P Juszczak, EM Pekalska, RPW Duin (2006), Outlier detection using ball descriptions with adjustable metric, DY Yeung, JT Kwok, A Fred, F Roli, D de Ridder (Eds.), In Structural, syntactic and statistical pattern recognition p.587-595, Springer.

TCW Landgrebe, DMJ Tax, P Paclik, RPW Duin (2006), The interaction between classification and rejection performance for distance-based reject-option classifiers, In Pattern Recognition Letters Volume 27 p.908-917.

CJ Veenman, DMJ Tax (2005), A weighted nearest mean classifier for sparse subspaces, s.n. (Eds.), In Proceedings of the IEEE Computer Society international conference on computer vision and pattern recognition (CPVR'05) p.1171-1176, IEEE.

DMJ Tax, RPW Duin (2005), Characterization one-class datasets, F Nicolls (Eds.), In Proceedings of the 16th Annual Symposium of the Pattern Recognition Association of South Africa p.21-26, IAPR.

CJ Veenman, DMJ Tax (2005), LESS: A model-based classifier for sparce subspaces, In IEEE Transactions on Pattern Analysis and Machine Intelligence Volume 27 p.1496-1500.