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P Paclik, TCW Landgrebe, DMJ Tax, RPW Duin (2005), On deriving the second-stage training set for trainable combiners, NC Oza, R Polikar, J Kittler, F Roli (Eds.), In Proceedings of the 6th International workshop multiple classifier systems 2005 p.136-146, Springer.

TCW Landgrebe, P Paclik, DMJ Tax, RPW Duin (2005), Optimising two-stage recognition systems, In Lecture Notes in Computer Science Volume 3541 p.206-215.

P Paclik, DMJ Tax, S Verzakov, RPW Duin (2005), Simplifying the model-based classifiers for multi-modal problems in classification of spectra, F Nicolls (Eds.), In Proceedings of the Sixteenth Annual Symposium of the Pattern Recognition Association of South Africa p.33-38, University of Cape Town.

RPW Duin, DMJ Tax (2005), Statistical pattern recognition, CH Chen, PSP Wang (Eds.), In Handbook of pattern recognition and computer vision, 3rd ed. p.3-24, World Scientific.

TCW Landgrebe, DMJ Tax, P Paclik, RPW Duin, C Andrew (2004), A combining strategy for ill-defined problems, F Nicolls (Eds.), In Proceedings of the 15th annual symposium of the Pattern Recognition Association of South Africa p.57-62, s.n..

DMJ Tax, KR Muller (2004), A consistency-based model selection for one-class classification, J Kittler, M Petrou, M Nixon (Eds.), In ICPR2004; Proceedings off the 17th international conference on pattern recognition p.363-366, IEEE.

C Lai, DMJ Tax, RPW Duin, EM Pekalska, P Paclik (2004), A study on combining image representations for image classification and retrieval, In International Journal of Pattern Recognition and Artificial Intelligence Volume 18 p.867-890.

F Heijden, RPW Duin, D de Ridder, DMJ Tax (2004), Classification, parameter estimation and state estimation; an engineering approach using MATLAB, Wiley.

TCW Landgrebe, P Paclik, DMJ Tax, S Verzakov, RPW Duin (2004), Cost-based classifier evaluation for imbalanced problems, A Fred, T Caelli, RPW Duin, A Campilho, D de Ridder (Eds.), In IAPR/SSPR 2004; Proceedings of the joint IAPR/SSPR international workshops on structural, syntactic, and statistical pattern recognition p.762-770, Springer.