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Z Al-Ars, AJ van de Goor (2003), Analyzing the impact of process variations on DRAM testing using border resistance traces, s.n. (Eds.), In ATS 2003; proceedings of the twelfth Asian test symposium p.24-27, IEEE.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), Dynamic faults in random-access-memories: concept, fault models and tests, In Journal of Electronic Testing: theory and applications Volume 19 p.195-205.

S Hamdioui, Z Al-Ars, AJ van de Goor, M Rodgers (2003), March SL: a test for all static linked memory faults, s.n. (Eds.), In ATS 2003; proceedings of the twelfth Asian test symposium p.372-377, IEEE.

Z Al-Ars, AJ van de Goor, J Braun, D Richter (2003), Optimizing stresses for testing DRAM cell defects using electrical simulations, N Wehn, D Verkest (Eds.), In DATE '03; design, automation and test in Europe p.484-489, IEEE.

Z Al-Ars, AJ van de Goor (2003), Static and dynamic behavior of memory cell array spot defects in embedded DRAMs, In IEEE Transactions on Computers Volume 52 p.293-309.

Z Al-Ars, AJ van de Goor (2003), Systematic memory test generation for DRAM defects causing two floating nodes, s.n. (Eds.), In MTDT 2003; Records of the 2003 international workshop on memory technology, design and testing p.27-32, IEEE.

Z Al-Ars, AJ van de Goor (2003), Test generation and optimization for DRAM cell defects using electrical simulation, In IEEE Transactions on Computer - Aided Design of Integrated Circuits and Systems Volume 22 p.1371-1384.

Z Al-Ars, AJ van de Goor (2002), Approximating infinite dynamic behavior for DRAM cell defects, In 20th VLSI Test symposium Proceedings p.401-407, IEEE.

Z Al-Ars, AJ van de Goor (2002), DRAM Specific approximation of the faulty behavior of cell defects, In Proceedings of the 11th Asian test symposium (ATS'02) p.98-104, IEEE.