Lizhou Wu, Mottaqiallah Taouil, Siddharth Rao, Erik Jan Marinissen, Said Hamdioui (2018), Electrical Modeling of STT-MRAM Defects, In International Test Conference - Proceedings p.1-10, IEEE.

Joost Hoozemans, Jeroen van Straten, Zaid Al-Ars, Stephan Wong (2018), Evaluating Auto-adaptation Methods for Fine-grained Adaptable Processors, M. Berekovic , R. Buchty, H. Hamann, D. Koch, T. Pionteck (Eds.), In Architecture of Computing Systems p.255-268, Springer.

Parag Bhosale, Marius Staring, Zaid Al-Ars, Floris F. Berendsen (2018), GPU-based stochastic-gradient optimization for non-rigid medical image registration in time-critical applications, Elsa D. Angelini, Bennett A. Landman (Eds.), In Medical Imaging 2018 p.1-8, SPIE.

Said Hamdioui, Pierre Emmanuel Gaillardon, Dietmar Fey, Tajana Simunic Rosing (2018), Guest Editorial Memristive-Device-Based Computing, IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 26 p.2581-2583.

Ernst Joachim Houtgast, Vlad-Mihai Sima, Koen Bertels, Zaid Al-Ars (2018), Hardware acceleration of BWA-MEM genomic short read mapping for longer read lengths, In Computational Biology and Chemistry Volume 75 p.54-64.

Augusto G. Erichsen, Anderson L. Sartor, Jeckson D. Souza, Monica M. Pereira, Stephan Wong, Antonio C.S. Beck (2018), ISA-DTMR: Selective Protection in Configurable Heterogeneous Multicores, N. Voros, M. Huebner, G. Keramidas, D. Goehringer, C. Antonpoulos, P.C. Diniz (Eds.), In Applied Reconfigurable Computing p.231-242, Springer.

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor, Wim Dehaene (2018), Impact and mitigation of SRAM read path aging, In Microelectronics Reliability Volume 87 p.158-167.

Joost Hoozemans, Jeroen van Straten, Stephan Wong (2018), Increasing resource utilization in mixed-criticality systems using a polymorphic VLIW processor, In Journal of Systems Architecture Volume 84 p.2-11.

Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars (2018), Industrial Evaluation of Transition Fault Testing for Cost Effective Offline Adaptive Voltage Scaling, In Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.289-292, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti (2018), Ionizing radiation modeling in DRAM transistors, In 2018 IEEE 19th Latin-American Test Symposium, LATS 2018 Volume 2018-January p.1-6, IEEE.