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H Calderón, S Vassiliadis (2003), Computer graphics and the MOLEN paradigm: a survey, s.n. (Eds.), In Proceedings of ProRISC 2003 p.23-36, STW.

T Niculiu, SD Cotofana (2003), Concurrent engineering for intelligent simulation, U Baake, J Herbst, I Graessler (Eds.), In ECEC 2003, tenth European concurrent engineering conference, tenth anniversary conference p.95-99, Eurosis.

I Schanstra, AJ van de Goor (2003), Consequences of RAM bitline twisting for test coverage, N Wehn, D Verkest (Eds.), In DATE'03; design automation and test in Europe p.1176-1177, IEEE Society.