Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2020), Impact of Magnetic Coupling and Density on STT-MRAM Performance, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.1211-1216, IEEE.

F. Smailbegovic, Cezar Reinbrecht, S. Hamdioui, M. Taouil (2020), Integrated circuit device for iot applications.

Abdulqader Mahmoud, Florin Ciubotaru, Frederic Vanderveken, Andrii V. Chumak, Said Hamdioui, Christoph Adelmann, Sorin Cotofana (2020), Introduction to spin wave computing, In Journal of Applied Physics Volume 128 p.61101-1 - 61101-44.

Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil, Behrad Niazmand, Tara Ghasempouri, Jaan Raik, Johanna Sepulveda (2020), LiD-CAT: A Lightweight Detector for Cache ATtacks, In 2020 IEEE European Test Symposium (ETS) p.1-6, IEEE.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2020), Mitigation of Sense Amplifier Degradation Using Skewed Design, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.1614-1617, IEEE.

Shayesteh Masoumian, Georgios Selimis, Roel Maes, Geert-Jan Schrijen, Said Hamdioui, Mottaqiallah Taouil (2020), Modeling Static Noise Margin for FinFET based SRAM PUFs, In 2020 IEEE European Test Symposium (ETS) p.1-6, IEEE.

A.N.N. Mahmoud, Frederic Vanderveken, Florin Ciubotaru, Christoph Adelmann, Sorin Cotofana, Said Hamdioui (2020), N-bit Data Parallel Spin Wave Logic Gate, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.642-645, IEEE.

Dario Mamone, Alberto Bosio, Alessandro Savino, Said Hamdioui, Maurizio Rebaudengo (2020), On the Analysis of Real-time Operating System Reliability in Embedded Systems, Luigi Dilillo, Mihalis Psarakis, Taniya Siddiqua (Eds.), In 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020 p.1-6, IEEE.

Tanveer Ahmad, Nauman Ahmed, Zaid Al-Ars, H. Peter Hofstee (2020), Optimizing performance of GATK workflows using Apache Arrow In-Memory data framework, In BMC Genomics Volume 21 p.1-14.

Troya Cagil Köylü, Cezar Rodolfo Wedig Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), RNN-based Detection of Fault Attacks on RSA, In 2020 IEEE International Symposium on Circuits and Systems (ISCAS) p.1-5, IEEE.