Moritz Fieback, Surya Nagarajan, Rajendra Bishnoi, Mehdi Tahoori, Mottaqiallah Taouil, Said Hamdioui (2020), Testing Scouting Logic-Based Computation-in-Memory Architectures, In Proceedings - 2020 IEEE European Test Symposium, ETS 2020 p.1-6, IEEE.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, L. M. Bolzani Poehls, Said Hamdioui (2019), DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs, In Proceedings - 2019 IEEE European Test Symposium, ETS 2019 Volume 2019-May p.1-2, IEEE.

Lizhou Wu, Siddharth Rao, Mottaqiallah Taouil, Guilherme Cardoso Medeiros, Moritz Fieback, Erik Jan Marinissen, Gouri Sankar Kar, Said Hamdioui (2019), Defect and Fault Modeling Framework for STT-MRAM Testing, In IEEE Transactions on Emerging Topics in Computing Volume 9 p.707-723.

M. Fieback, Lizhou Wu, Guilherme Cardoso Medeiros, Hassen Aziza, S Rao, Erik Jan Marinissen, Mottaqiallah Taouil, Said Hamdioui (2019), Device-Aware Test: A New Test Approach Towards DPPB Level, In 2019 IEEE International Test Conference, ITC 2019, IEEE.

A. Bosio, I. O'Connor, G.S. Rodrigues, F.K. Lima, E.I. Vatajelu, G. di Natale, L. Anghel, Surya Nagarajan, M.C.R. Fieback, S. Hamdioui (2019), Rebooting Computing: The Challenges for Test and Reliability, In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) p.1-6, IEEE.

Said Hamdioui, M. Fieback, S. Nagarajan, Mottaqiallah Taouil (2019), Testing Computation-in-Memory Architectures Based on Emerging Memories, In 2019 IEEE International Test Conference (ITC), IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Marco Rovatti (2018), Ionizing radiation modeling in DRAM transistors, In 2018 IEEE 19th Latin-American Test Symposium, LATS 2018 Volume 2018-January p.1-6, IEEE.

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2018), Testing Resistive Memories: Where Are We and What Is Missing?, In International Test Conference 2018 - Proceedings p.1-9, IEEE.