Moritz Fieback, Guilherme Cardoso Medeiros, Lizhou Wu, Hassen Aziza, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui (2022), Defects, Fault Modeling, and Test Development Framework for RRAMs, In ACM Journal on Emerging Technologies in Computing Systems Volume 18.

T.S. Copetti, M. Nilovic, M. Fieback, T. Gemmeke, S. Hamdioui, L.M. Bolzani Poehls (2022), Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs, In Proceedings of the 2022 IEEE 23rd Latin American Test Symposium (LATS) p.1-6, IEEE.

G. C. Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. B. Poehls, S. Hamdioui (2022), Hierarchical Memory Diagnosis, In Proceedings - 2022 IEEE European Test Symposium, ETS 2022, Institute of Electrical and Electronics Engineers (IEEE).

Moritz Fieback, Christopher Münch, Anteneh Gebregiorgis, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Mehdi Tahoori (2022), PVT Analysis for RRAM and STT-MRAM-based Logic Computation-in-Memory, In Proceedings of the 2022 IEEE European Test Symposium (ETS) p.1-6, IEEE.

P. Bernardi, R. Cantoro, A. Coyette, W. Dobbeleare, M. Fieback, A. Floridia, G. Gielenk, A. M. Guerriero, S. Hamdioui, More Authors (2022), Recent Trends and Perspectives on Defect-Oriented Testing, Alessandro Savino, Paolo Rech, Stefano Di Carlo, Dimitris Gizopoulos (Eds.), In Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022, Institute of Electrical and Electronics Engineers (IEEE).

Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui (2022), Structured Test Development Approach for Computation-in-Memory Architectures, C. Ceballos (Eds.), In Proceedings of the 2022 IEEE International Test Conference in Asia (ITC-Asia) p.61-66, IEEE.

M. Fieback (2022), Testing RRAM and Computation-in-Memory Devices: Defects, Fault Models, and Test Solutions, PhD Thesis Delft University of Technology.

T.C. Köylü, M. Fieback, S. Hamdioui, M. Taouil (2022), Using Hopfield Networks to Correct Instruction Faults, In 2022 IEEE 31st Asian Test Symposium (ATS) p.102-107, IEEE.

H. Aziza, S. Hamdioui, M. Fieback, M. Taouil, M. Moreau (2021), Density Enhancement of RRAMs using a RESET Write Termination for MLC Operation, In 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1877-1880, IEEE.

G. Cardoso Medeiros, M. Fieback, A. Gebregiorgis, M. Taouil, L. Bolzani Poehls, S. Hamdioui (2021), Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.