E. Brum, M. Fieback, T.S. Copetti, H. Jiayi, S. Hamdioui, F. Vargas, L.M. Bolzani Poehls (2021), Evaluating the Impact of Process Variation on RRAMs, In 2021 IEEE 22nd Latin American Test Symposium, LATS 2021 p.1-6, IEEE.

G. Cardoso Medeiros, M. Fieback, L. Wu, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Hard-to-Detect Fault Analysis in FinFET SRAMs, In IEEE Transactions on Very Large Scale Integration (VLSI) Systems Volume 29 p.1271-1284.

G. Cardoso Medeiros, M. Fieback, Thiago Copetti, A.B. Gebregiorgis, M. Taouil, L. M. Bolzani Poehls, S. Hamdioui (2021), Improving the Detection of Undefined State Faults in FinFET SRAMs, In International Conference on Design & Technology of Integrated System in Nanoscale Era (DTIS), IEEE.

Moritz Fieback, Guilherme Cardoso Medeiros, Anteneh Gebregiorgis, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2021), Intermittent Undefined State Fault in RRAMs, In 2021 IEEE European Test Symposium (ETS), IEEE.

Hassan Aziza, Said Hamdioui, Moritz Fieback, Mottaqiallah Taouil, Mathieu Moreau, Patrick Girard, Arnaud Virazel, Karine Coulié (2021), Multi-level control of resistive ram (Rram) using a write termination to achieve 4 bits/cell in high resistance state, In Electronics (Switzerland) Volume 10.

L. M.Bolzani Poehls, M. C.R. Fieback, S. Hoffmann-Eifert, T. Copetti, E. Brum, S. Menzel, S. Hamdioui, T. Gemmeke (2021), Review of Manufacturing Process Defects and Their Effects on Memristive Devices, In Journal of Electronic Testing: Theory and Applications (JETTA) Volume 37 p.427-437.

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, Institute of Electrical and Electronics Engineers (IEEE).

H. Aziza, M. Moreau, M. Fieback, M. Taouil, S. Hamdioui (2020), An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs), In IEEE Access Volume 8 p.137263-137274.

L. Wu, M. Fieback, M. Taouil, S. Hamdioui (2020), Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level, In 2020 IEEE European Test Symposium (ETS) p.1-2, Institute of Electrical and Electronics Engineers (IEEE).

Rajendra Bishnoi, Lizhou Wu, Moritz Fieback, Christopher Munch, Sarath Mohanachandran Nair, Mehdi Tahoori, Ying Wang, Huawei Li, Said Hamdioui (2020), Special Session - Emerging Memristor Based Memory and CIM Architecture: Test, Repair and Yield Analysis, In Proceedings - 2020 IEEE 38th VLSI Test Symposium, VTS 2020 Volume 2020-April, IEEE.