VP Iordanov, GW Lubking, R Ishihara, RF Wolffenbuttel, PM Sarro, MJ Vellekoop (2002), Silicon thin-film UV filter for NADH fluorescence analysis, In Sensors and Actuators A: Physical: an international journal devoted to research and development of physical and chemical transducers Volume A 97-98 p.161-166.

R Ishihara, BD van Dijk, PC van der Wilt, JW Metselaar, CIM Beenakker, Y Hiroshima, D Abe, S Higashi, S Inoue, T Shimoda (2002), Single-crystalline Si thin film transistors with electron cyclotron resonance plasma enhanced chemical vapor deposited gate SiO2, In EURODISPLAY 2002 proceedings p.407-409, s.n..

R Ishihara, BD van Dijk, PC van der Wilt, JW Metselaar, CIM Beenakker (2002), Single-crystalline Si thin-film TFTs fabricated with ¿-Czochralski (grain-filter) process, M Matsumura (Eds.), In IMID'02 Digest p.159-162, s.n..

R Ishihara, PC van der Wilt, BD van Dijk, A Burtsev, JW Metselaar, CIM Beenakker (2002), Single-crystalline Si thin-film transistors fabricated with ¿-Czochralski (grain-filter) process, M Matsumura (Eds.), In AM-LCD 2002 International Workshop on Active-Matrix LCDs-TFT Technologies and Related Materials p.53-56, s.n..

R Ishihara, BD van Dijk, PC van der Wilt, JW Metselaar, CIM Beenakker (2002), X-X: single-crystalline Si TFTs fabricated with ¿-Czochralski (grain-filter) process, YB Kim, IG Kang (Eds.), In IMID 2002 2nd International Meeting on Information Display p.159-162, s.n..

R Ishihara (2002), c-Si TFTs fabricated with Micro-Czochralski processed grains and ECR-CVD gate oxide, Delft University of Technology Volume Progress Report 1.

FC Voogt, R Ishihara (2001), A combined TEM and time-resolved optical reflectivity investigation into the excimer-laser crystallization of a-Si films, In Thin Solid Films Volume 383 p.45-47.

R Ishihara, PC van der Wilt, BD van Dijk, A Burtsev, FC Voogt, GJ Bertens, JW Metselaar, CIM Beenakker (2001), Advanced excimer-laser crystallization techniques of Si thin-film for location control of large grain on glass, EF Kelley, T Voutsas (Eds.), In Proceedings of SPIE Vol. 4295 p.14-23, SPIE.

R Ishihara (2001), Effects of grain-boundaries in excimer-laser crystallized poly-Si thin-film transistors, H Ryssel, G Wachutka, H Grünbacher (Eds.), In Proceedings ESSDERC 2001 p.479-482, Frontier Group.

R Ishihara (2001), Effects of grain-boundaries on excimer-laser crystallized poly-Si thin-film transistors, In Proceedings AM-LCD 01 p.259-260, Japan Society of Applied Physics.