Abdulqader Mahmoud, Frederic Vanderveken, Christoph Adelmann, Florin Ciubotaru, Said Hamdioui, Sorin Cotofana (2020), 4-output Programmable Spin Wave Logic Gate, J. Guerrero (Eds.), In 2020 IEEE 38th International Conference on Computer Design (ICCD) p.332-335, IEEE.

H.A. Du Nguyen, J. Yu, M.F.M. Abu Lebdeh, M. Taouil, S. Hamdioui, Francky Catthoor (2020), A Classification of Memory-Centric Computing, In ACM Journal on Emerging Technologies in Computing Systems Volume 16 p.1-26.

Guilherme Cardoso Medeiros, Cemil Cem Gursoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui (2020), A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs, Giorgio Di Natale, Cristiana Bolchini, Elena-Ioana Vatajelu (Eds.), In Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 p.792-797, IEEE.

Tara Ghasempouri, Jaan Raik, Kolin Paul, Cezar Reinbrecht, Said Hamdioui, Mottaqiallah Taouil (2020), A Security Verification Template to Assess Cache Architecture Vulnerabilities, In 2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) p.1-6, IEEE.

H. Aziza, M. Moreau, M. Fieback, M. Taouil, S. Hamdioui (2020), An Energy-Efficient Current-Controlled Write and Read Scheme for Resistive RAMs (RRAMs), In IEEE Access Volume 8 p.137263-137274.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Said Hamdioui, Christian Sauer (2020), Combining Fault Analysis Technologies for ISO26262 Functional Safety Verification, R.S. Bilof (Eds.), In Proceedings - 2019 IEEE 28th Asian Test Symposium, ATS 2019 Volume 2019-December p.129-134, IEEE.

Felipe Augusto da Silva, Ahmet Cagri Bagbaba, Sandro Sartoni, Riccardo Cantoro, Matteo Sonza Reorda, Said Hamdioui, Christian Sauer (2020), Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs, In 2020 IEEE European Test Symposium (ETS) p.1-6, IEEE.

L. Wu, M. Fieback, M. Taouil, S. Hamdioui (2020), Device-Aware Test for Emerging Memories: Enabling Your Test Program for DPPB Level, In 2020 IEEE European Test Symposium (ETS) p.1-2, IEEE.

Daniel Kraak, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor (2020), ESRAM Reliability: Why is it still not optimally solved?, In Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020, IEEE.

Mahdi Zahedi, Mahta Mayahinia, Muath Abu Lebdeh, Stephan Wong, Said Hamdioui (2020), Efficient organization of digital periphery to support integer datatype for memristor-based cim, L. O'Conner (Eds.), In 2020 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) p.216-221, IEEE.