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Matthijs A. Reukers, Yongding Tian, Zaid Al-Ars, Peter Hofstee, Matthijs Brobbel, Johan Peltenburg, Jeroen van Straten (2023), An Intermediate Representation for Composable Typed Streaming Dataflow Designs, In CEUR Workshop Proceedings.

Heba Abunahla, Yawar Abbas, Anteneh Gebregiorgis, Waqas Waheed, Baker Mohammad, Said Hamdioui, Anas Alazzam, Moh’d Rezeq (2023), Analog monolayer SWCNTs-based memristive 2D structure for energy-efficient deep learning in spiking neural networks, In Scientific Reports Volume 13.

Muhammad Umair Khan, Yawar Abbas, Heba Abunahla, Moh'd Rezeq, Anas Alazzam, Nahla Alamoodi, Baker Mohammad (2023), Biocompatible humidity sensor using paper cellulose fiber/GO matrix for human health and environment monitoring, In Sensors and Actuators B: Chemical Volume 393.

Yawar Abbas, Firdous Ahmad Deader, Heba Abunahla, Mohammad Baker, Moh'd Rezeq (2023), Carbon Nanotubes Dispersion for Humidity Sensor Devices, In 2023 IEEE 23rd International Conference on Nanotechnology, NANO 2023 p.325-328, IEEE.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Leticia Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui (2023), Characterization and Test of Intermittent Over RESET in RRAMs, In Proceeding of the 2023 IEEE 32nd Asian Test Symposium (ATS), IEEE.

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Yongding Tian, Zhuoran Guo, Jiaxuan Zhang, Zaid Al-Ars (2023), DFL: High-Performance Blockchain-Based Federated Learning, In Distributed Ledger Technologies: Research and Practice Volume 2 p.1-25.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Ziwei Zhang, Mottaqiallah Taouil, Said Hamdioui (2023), Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.

Manil Dev Gomony, Anteneh Gebregiorgis, Moritz Fieback, Marc Geilen, Sander Stuijk, Jan Richter-Brockmann, Rajendra Bishnoi, Mottaqiallah Taouil, Said Hamdioui, More Authors (2023), Dependability of Future Edge-AI Processors: Pandora’s Box, In Proceedings of the 2023 IEEE European Test Symposium (ETS), IEEE.