Hamed Salah, Reza Hassanpour, Georgi Gaydadjiev (2024), Matrix Pencil for RFID Collision Recovery, In IEEE Access.

Thomas Makryniotis, Georgi Gaydadjiev, Said Hamdioui, Mottaqiallah Taouil (2024), Multi-Level FeFET-Based CAM Address Decoder, In 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE.

Erbing Hua, Heba Abunahla, Georgi Gaydadjiev, Said Hamdioui, Ryoichi Ishihara (2024), Multi-level forming-free HfO₂-based ReRAM for energy-efficient computing, In DRC 2024 - 82nd Device Research Conference, IEEE.

Dirk De Ridder, Muhammad Ali Siddiqi, Justin Dauwels, Wouter A. Serdijn, Christos Strydis (2024), NeuroDots: From Single-Target to Brain-Network Modulation: Why and What Is Needed?, In Neuromodulation p.711-729.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2024), Online Detection of Unique Faults in RRAMs, In 2024 IEEE European Test Symposium (ETS).

Yingfu Xu, Kevin Shidqi, Gert-Jan van Schaik, Refik Bilgic, Alexandra Dobrita, Shenqi Wang, Anteneh Gebregiorgis, Said Hamdioui, Amirreza Yousefzadeh, More Authors (2024), Optimizing event-based neural networks on digital neuromorphic architecture: A comprehensive design space exploration, In Frontiers in Neuroscience Volume 18.

Alireza Raisiardali, Ali Siddiqi, Christos Strydis, Said Hamdioui, Dante Gabriel Muratore, Rajendra Bishnoi (2024), Real-Time Supervised Spiking Neural Network for Cerebellar Purkinje Cells Spike Detection and Classification, In Proceedings - 2024 International Conference on Neuromorphic Systems, ICONS 2024 p.9-15, IEEE.

Sumit Diware, Koteswararao Chilakala, Rajiv V. Joshi, Said Hamdioui, Rajendra Bishnoi (2024), Reliable and Energy-efficient Diabetic Retinopathy Screening using Memristor-based Neural Networks, In IEEE Access Volume 12 p.47469 - 47482.

Giovanni Finocchio, Jean Anne C. Incorvia, Joseph S. Friedman, Qu Yang, Anna Giordano, Julie Grollier, Hyunsoo Yang, Sorin D. Cotofana, Peng Lin, More Authors (2024), Roadmap for unconventional computing with nanotechnology, In Nano Futures.

Hanzhi Xun, Moritz Fieback, Mohammad Amin Yaldagard, Sicong Yuan, Erbing Hua, Hassen Aziza, Mottaqiallah Taouil, Said Hamdioui (2024), Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs, L. O’Conner (Eds.), In Proceedings of the 2024 IEEE International Test Conference (ITC) p.374-383, IEEE.