Johan Peltenburg, Jeroen van Straten, Matthijs Brobbel, H. Peter Hofstee, Zaid Al-Ars (2019), Supporting Columnar In-memory Formats on FPGA: The Hardware Design of Fletcher for Apache Arrow, Christian Hochberger, Andreas Koch, Pedro Diniz, Roger Woods, Brent Nelson (Eds.), In Applied Reconfigurable Computing p.32-47, Springer.

Sohaib Majzoub, Mottaqiallah Taouil, Said Hamdioui (2019), System-level sub-20 nm planar and FinFET CMOS delay modelling for supply and threshold voltage scaling under process variation, In Journal of Low Power Electronics Volume 15 p.1-10.

Said Hamdioui, M. Fieback, S. Nagarajan, Mottaqiallah Taouil (2019), Testing Computation-in-Memory Architectures Based on Emerging Memories, In 2019 IEEE International Test Conference (ITC).

Zaid Al-Ars, Twan Basten, Ad de Beer, Marc Geilen, Dip Goswami, Pekka Jaäskelaïnen, Jiøí Kadlec, Marcos Martinezde Alejandro, Francesca Palumbo, More Authors (2019), The FitOptiVis ECSEL Project: Highly Efficient Distributed Embedded Image/Video Processing in Cyber-Physical Systems , In CF'19 p.333-338, Association for Computing Machinery (ACM).

Jintao Yu, Hoang Anh Du Nguyen, Muath Abu Lebdeh, Mottaqiallah Taouil, Said Hamdioui (2019), Time-division Multiplexing Automata Processor, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.794-799.

Tim Fritzmann, Uzair Sharif, Daniel Müller-Gritschneder, Cezar Reinbrecht, Ulf Schlichtmann, Johanna Sepulveda (2019), Towards Reliable and Secure Post-Quantum Co-Processors based on RISC-V, In 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE) p.1148-1153.

Josie E.Rodriguez Condia, Felipe A. Da Silva, S. Hamdioui, C. Sauer, M. Sonza Reorda (2019), Untestable faults identification in GPGPUs for safety-critical applications, In 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019 p.570-573.

J. Van Staveren, C. Garcia Almudever, G. Scappucci, M. Veldhorst, M. Babaie, E. Charbon, F. Sebastiano (2019), Voltage References for the Ultra-Wide Temperature Range from 4.2K to 300K in 40-nm CMOS, In ESSCIRC 2019 - IEEE 45th European Solid State Circuits Conference p.37-40.

Shanshan Ren (2018), Accelerating DNA Variant Calling Algorithms on High Performance Computing Systems, PhD Thesis Delft University of Technology.

G.C. Medeiros, L.M. Bolzani Poehls, M. Taouil, F. Luis Vargas, S. Hamdioui (2018), A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs, In Microelectronics Reliability Volume 88-90 p.355-359.